Optimized self-adaptive microscopic imaging method and device based on machine learning
A technology of machine learning and microscopic imaging, which is applied in instrumentation, image enhancement, image data processing, etc., can solve the problems of complex compensation algorithm, slow imaging speed, difficult realization of AO compensation distortion phase, etc., and achieve high image quality and high optimization Performance, Effect of High Speed Wavefront Distortion Compensation
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[0029] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.
[0030] Before introducing the optimized adaptive microscopic imaging method and device based on machine learning, the functions to be realized by the present invention will be briefly introduced.
[0031] The problem to be solved by the present invention is: using a point-scanning optical microscope combined with an adaptive optics method of machine learning, it can also obtain fast, high-optimization performance and high-quality imaging capabilities when the distortion exceeds the range of the wavefront modulator.
[0032] Point...
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