Unlock instant, AI-driven research and patent intelligence for your innovation.

Test device and its test method

A technology for testing devices and testing methods, which is applied in the direction of electric solid-state devices, semiconductor devices, and single semiconductor device testing. It can solve problems such as low device life, decreased current efficiency of stacked OLEDs, and weak charge generation capabilities, and achieve improved luminous efficiency. , improve the life, improve the effect of test accuracy

Active Publication Date: 2021-08-13
YUNGU GUAN TECH CO LTD
View PDF12 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Based on this, it is necessary to provide a test device and its test method for the problem that the previous charge generation layer has weak charge generation ability, which leads to a decrease in the current efficiency of the laminated OLED and a low device life.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Test device and its test method
  • Test device and its test method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] In order to make the above objects, features and advantages of the present invention more comprehensible, specific implementations of the present invention will be described in detail below in conjunction with the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. However, the present invention can be implemented in many other ways different from those described here, and those skilled in the art can make similar improvements without departing from the connotation of the present invention, so the present invention is not limited by the specific embodiments disclosed below.

[0036] It should be noted that when an element is referred to as being “disposed on” another element, it may be directly on the other element or there may also be an intervening element. When an element is referred to as being "connected to" another element, it can be directly connected t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a test device and a test method thereof. Wherein, the test device includes a first electrode, an electron transport unit, a charge generation layer, a hole transport unit, and a second electrode stacked; the charge generation layer includes an N-type doped layer and a P-type doped layer, and the N The P-type doped layer is adjacent to the electron transport unit, and the P-type doped layer is adjacent to the hole transport unit. The above test device removes the light-emitting layer, avoiding the influence of the light-emitting layer on the performance of the device, and testing the charge generation ability and stability of the charge generation layer alone can improve the test accuracy.

Description

technical field [0001] The invention relates to the display field, in particular to a test device and a test method thereof. Background technique [0002] The stacked OLED device consists of two light-emitting units connected in series by the charge generation layer, which can achieve high current efficiency at low current density, and low current drive can also prolong the life of the OLED device, so it has been widely used. [0003] To improve the lifetime of stacked OLEDs, charge generation layers with efficient charge generation, charge transport, and charge injection properties are required. How to make the charge generation layer generate carriers efficiently, transport carriers quickly and inject carriers effectively is the key issue to obtain high-performance stacked OLED devices. However, the current charge generation layer itself has a weak charge generation capability, which leads to a decrease in the current efficiency of the laminated OLED and an unsatisfactory...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/26H01L51/52
CPCG01R31/2601H10K50/19H10K50/171H10K71/70H10K50/17H10K50/155H10K50/165
Inventor 席昭洋
Owner YUNGU GUAN TECH CO LTD