An automatic on-chip test system for the noise figure of a low-noise amplifier chip
A technology of automated testing and noise figure, which is applied in automated testing systems, electronic circuit testing, and electrical measurement, and can solve problems that affect test accuracy, low efficiency, and high risk of device and equipment damage
Active Publication Date: 2021-09-14
ZHEJIANG CHENGCHANG TECH
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Problems solved by technology
Ordinary test systems can only perform simple summation based on the insertion loss of RF probes provided by the manufacturer and the insertion losses of devices such as RF adapters and coaxial cables, which are used for input insertion during noise figure testing. loss compensation
This compensation method has poor precision and low efficiency, which seriously affects the mass on-chip testing of low-noise amplifier chips.
The traditional manual test system has extremely low test efficiency. For example, when compensating for the insertion loss at the input end of the amplifier, each time the test frequency band is changed, it is necessary to manually calculate the insertion loss at the input end and write it into the insertion loss table of the spectrum analyzer one by one.
Moreover, the traditional manual test system has a high probability of misoperation, which affects the test accuracy, and there is a high risk of damage to devices and equipment
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[0022] Embodiments of the present invention are described in detail below, wherein the same or similar reference numerals represent the same or similar elements or elements with similar functions. The embodiments described below by referring to the figures are exemplary, and are only used to explain the present invention and not to limit the present invention.
[0023] Those skilled in the art can understand that, unless otherwise defined, all terms (including technical terms and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art to which this invention belongs. It should also be understood that terms such as those defined in commonly used dictionaries should be understood to have a meaning consistent with the meaning in the context of the prior art, and unless defined as herein, will not be used in an idealized or overly formal meaning to explain.
[0024] The present invention will be further described below in c...
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The invention discloses an automatic on-chip test system for the noise coefficient of a low-noise amplifier chip, which comprises a spectrum analyzer, a noise source, a radio frequency coaxial line, an adapter, a radio frequency probe, an on-chip insertion loss compensation system, and an automatic test system , the on-chip insertion loss compensation system includes a signal source, a dual directional coupler, a receiver, a radio frequency coaxial line, an adapter, a radio frequency probe, a coaxial calibration unit and an on-chip calibration unit; the invention provides a low noise amplifier The chip noise figure automatic on-chip test system realizes the accurate compensation of the loss introduced by the input terminal of the amplifier during the noise figure test, and improves the test accuracy.
Description
technical field [0001] The invention relates to the field of electrical performance testing of integrated circuit chips, more specifically, it relates to an automatic on-chip testing system for noise coefficient of low-noise amplifier chips. Background technique [0002] Low noise amplifier chips are key components in communication and radar systems. The noise figure of the low-noise amplifier chip directly affects the receiver sensitivity of the communication and radar systems, and it is of great significance to accurately measure the noise figure of the low-noise amplifier chip. [0003] The noise figure test of the low noise amplifier chip generally adopts the Y coefficient method and the cold source method, corresponding to the spectrum analyzer and the vector network analyzer respectively. However, the price of the vector network analyzer equipped with noise figure analysis is extremely expensive. Considering the test cost, the noise figure test system based on the hig...
Claims
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IPC IPC(8): G01R31/28
CPCG01R31/2834G01R31/2851G01R31/2856
Inventor 丁旭王立平
Owner ZHEJIANG CHENGCHANG TECH