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Depth measurement device based on TOF image sensor

An image sensor, depth measurement technology, applied in the field of optical measurement, can solve problems such as accuracy increase, and achieve the effect of improving measurement accuracy

Pending Publication Date: 2019-11-19
SHENZHEN ORBBEC CO LTD
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Problems solved by technology

[0004] In contrast, TOF technology does not require complex image processing calculations (such as structured light image matching calculations), and can maintain relatively high measurement accuracy at medium and long distances; while structured light technology has very high accuracy at short-range measurements. Accuracy, but accuracy increases at least linearly with distance

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  • Depth measurement device based on TOF image sensor
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  • Depth measurement device based on TOF image sensor

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Embodiment Construction

[0024] In order to make the technical problems, technical solutions and beneficial effects to be solved by the embodiments of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0025] It should be noted that when an element is referred to as being “fixed” or “disposed on” another element, it may be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element. In addition, the connection can be used for both fixing and circuit communication.

[0026] It is to be understood that the terms "length", "width", "top", "bottom", "front", "rear", "left", ...

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Abstract

The invention provides a depth measurement device based on a TOF image sensor. The depth measurement device comprises a light emitting module including a first light source for emitting a beam with modulated amplitude on a timing sequence, wherein a patterned optical element is used for emitting a structural light beam to a target object after receiving the light beam; a floodlighting light sourcemodule including a second light source for emitting a floodlighting beam with modulated amplitude on the timing sequence to the target object; a TOF image sensor including at least one pixel and usedfor receiving the structural light beam and forming a first electric signal; or receiving the floodlight beam and forming a second electric signal; a control and processing circuit for receiving thefirst electric signal and forming a structural light pattern, and computing a first depth image of the target object by utilizing the structural light pattern; or receiving the second electric signalto compute the phase difference, computing the flight time that the floodlighting beam is received from being emitted, and computing a second depth image of the target object based on the flight time.The measurement precision of the depth measurement device is improved.

Description

technical field [0001] The invention relates to the technical field of optical measurement, in particular to a depth measurement device based on a TOF image sensor. Background technique [0002] The full name of ToF is Time-of-Flight, that is, time of flight. ToF ranging technology is a technology that achieves precise ranging by measuring the round-trip flight time of light pulses between the transmitting / receiving device and the target object. In ToF technology, the technology of directly measuring the time of flight of light is called dToF (direct-TOF); the emitted optical signal is periodically modulated, and the phase delay of the reflected optical signal relative to the emitted optical signal is measured, and then by The measurement technology for calculating the time of flight by phase delay is called iToF (Indirect-TOF) technology. According to different modulation and demodulation methods, it can be divided into a continuous wave (Continuous Wave, CW) modulation an...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01S17/89G01S17/10G01S17/32G01S7/486G06T7/521
CPCG01S7/4865G01S17/10G01S17/32G01S17/89G06T7/521
Inventor 武万多王兆民
Owner SHENZHEN ORBBEC CO LTD
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