A Fast and Stable Uncooled Infrared Focal Plane Readout Circuit

Abstract

The invention discloses a fast and stable uncooled infrared focal plane readout circuit, which includes a microbolometer unit circuit array, a column-level amplifier circuit and a bias voltage stabilization circuit; The thermal meter is strobed row by row and connected to the readout channel; the column-level amplifier circuit provides a bias voltage for the microbolometer and filters, amplifies and converts the induced current into an output voltage, and then outputs it to the off-chip row by row; the bias voltage The stabilizing circuit introduces an adaptive driving voltage when the microbolometer unit is changing rows, and provides the driving current required for changing rows to ensure fast and stable bias voltage. The uncooled infrared focal plane readout circuit of the present invention can be fast and stable when working at low temperature, and ensures the maximum integration time so as to reduce the NETD of the detector.

Description

technical field [0001] The invention relates to infrared imaging technology, in particular to a fast and stable uncooled infrared focal plane readout circuit in the infrared imaging technology. Background technique [0002] At present, uncooled infrared imaging technology has important applications in military, industrial and agricultural, medical, astronomical and other fields. As the core of the uncooled infrared imaging technology, the infrared focal plane array includes two parts: an infrared detector array and a readout circuit. Among them, the microbolometer focal plane array (FPA) has high sensitivity and is the most widely used uncooled infrared focal plane array. Its working principle is that the temperature of the heat-sensitive material changes after absorbing the incident infrared radiation, thereby It causes the change of its own resistance value, and detects the magnitude of the infrared radiation signal by measuring the change of its resistance value. [000...

AI Technical Summary

Problems solved by technology

The problem caused by this connection method is that a huge time constant is formed by the pixel resistance and parasitic capacitance at the pixel gating node, which leads to a particularly long stabilization time and a decrease in the performance of the detector NETD when working at low temperature.

For this reason, it is necessary to design a bias voltage stabilization circuit to solve the problem that the pixel bias voltage stabilizes for a long time at low temperature under the connection of a shared bridge pier

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