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Test system and method for screening bad Dies in Wafer

A test system and test method technology, applied in static memory, instruments, etc., can solve the problems of inability to meet actual production and low efficiency, achieve broad market application prospects, and improve test efficiency.

Active Publication Date: 2019-12-06
SHENZHEN YILIAN INFORMATION SYST CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In traditional technology, there are many tools for manually testing wafers on the market, but the efficiency of manual testing is very low, and there is no way to meet the needs of actual production

Method used

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  • Test system and method for screening bad Dies in Wafer

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Embodiment Construction

[0051] In order to make the purpose, technical solution and advantages of the present application clearer, the present application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present application, and are not intended to limit the present application.

[0052] In one embodiment, such as figure 1 As shown, a test system 100 for screening bad Dies in Wafer is provided: a test host 110, a transmission card 120, a plurality of test cards 130 and a probe card 140;

[0053] Wherein, the test host 110 communicates with the transmission card 120 through the serial port to obtain the test result of each test channel on each test card 130;

[0054] The transmission card 120 is used to supply power to a plurality of test cards 130, and the plurality of test cards 130 communicate with the test host 110 through the serial port of the...

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Abstract

The invention relates to a test system and method for screening bad Dies in Wafer, computer equipment and a storage medium. The system comprises a test host, a transmission card, a plurality of test cards and a probe card, wherein the test host communicates with the transmission card through a serial port and is used for acquiring a test result of each test channel on each test card, the transmission card is used for supplying power to the plurality of test cards, and the plurality of test cards are communicated with the test host through serial ports of the transmission card; and the test cards can be used for testing a plurality of channels, and signals and a power supply on each channel are connected to the corresponding Wafer to be tested through the probe card. The testing system andmethod can be directly applied to an automatic platform, automatic testing of multiple channels can be achieved, and the testing efficiency can be effectively improved.

Description

technical field [0001] The invention relates to the technical field of solid-state hard disks, in particular to a testing system, method, computer equipment and storage medium for screening bad Dies in Wafers. Background technique [0002] At present, Wafer, also known as a wafer, refers to a silicon wafer used in the production of silicon semiconductor integrated circuits. Because its shape is circular, it is called a wafer; it can be processed into various circuit element structures on a silicon wafer, and becomes an effective wafer. Integrated circuit products with specific electrical functions. Wafers are used in the largest amount in the company and are widely used. If the purchased wafers can be tested to screen out defects, the yield rate of finished products can be improved, costs can also be saved, and the manufacturing and testing cycle can be shortened. [0003] In the traditional technology, there are many tools for manually testing wafers on the market, but the...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56G11C29/50
CPCG11C29/50G11C29/56G11C29/56008G11C2029/5006G11C2029/5604
Inventor 杨林英陈道华
Owner SHENZHEN YILIAN INFORMATION SYST CO LTD