Pulse repair-based pseudo peak correction method

Abstract

The invention discloses a pulse repair-based pseudo peak correction method. The invention mainly aims to the problems of pulse abrupt change caused by the frequent reset of the switch of a switch reset type pre-amplification circuit and pseudo peaks caused by the pulse abrupt change. The method mainly comprises the following steps that: weak current signals outputted by a pre-amplification circuitare acquired, the weak current signals are converted through a differentiating circuit, so that negative exponential signals Vn are obtained; the negative exponential signals Vn are amplified, the amplitude range of the amplified negative exponential signals Vn is 0-2 V, analog-to-digital conversion is carried out on the amplified negative exponential signals, so that a negative exponential pulsesequence V1n is obtained; the sampling points of the negative exponential pulse sequence V1n are judged, when a sampling point which is zero appears, a corresponding pulse is marked as a pulse abruptpulse, an optimal repair algorithm is called to repair the abrupt change pulse, so that a repaired negative exponential pulse sequence V2n can be obtained; digital trapezoidal shaping is performed onthe negative exponential signals V2n, so that a shaping result is stored into an FIFO unit; and multi-channel spectrum forming is performed on the shaping result.

Description

technical field [0001] The invention relates to the field of signal processing, in particular to a false peak correction method based on pulse repair. Background technique [0002] The frequent reset of the switch reset type preamplifier integrated in the semiconductor detector leads to the generation of a large number of abrupt pulses. If these abrupt pulses are not eliminated or repaired, they will exist in the form of false peaks in front of the all-energy peak in the final spectrum, seriously affecting The identification of the characteristic peaks of trace elements in the energy spectrum analysis is improved, and the count rate of the characteristic peaks is also reduced. [0003] At present, the commonly used false peak processing method is to directly eliminate the abrupt pulses. Although this false peak processing method can achieve the purpose of eliminating false peaks, it also has the defect of count rate loss. [0004] Therefore, it is necessary to propose a fal...

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Problems solved by technology

[0002] The frequent reset of the switch reset type preamplifier integrated in the semiconductor detector leads to the generation of a large number of abrupt pulses. If these abrupt pulses are not eliminated or repaired, they will exist in the form of false peaks in front of the all-energy peak in the final spectrum, seriously affecting It improves the identification of the characteristic peaks of trace elements in the energy spectrum analysis, and also reduces the count rate of the characteristic peaks

[0003] At present, the commonly used false peak processing method is to directly eliminate the mutation pulse. Although this false peak processing method can achieve the purpose of eliminating false peaks, it also has the defect of count rate loss.

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