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Operational amplifier test circuit and system

A technology of operational amplifier testing and circuit, applied in the direction of measuring electricity, measuring electrical variables, electronic circuit testing, etc., to achieve the effect of reducing test cost and quantity

Pending Publication Date: 2019-12-20
BEIJING HUAFENG TEST & CONTROL TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] Based on this, it is necessary to provide an operational amplifier test circuit and system for the problem of a large number of voltage and current sources in the operational amplifier test circuit

Method used

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  • Operational amplifier test circuit and system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0093] See image 3 , this embodiment mainly detects the common-mode rejection ratio of the operational amplifier DUT to be tested, that is, the ratio of the differential-mode voltage gain to the common-mode voltage gain of the operational amplifier DUT to be tested within the specified range of power supply voltage and output voltage. In this embodiment, the first resistor and the third resistor are R I , the resistance value of the fifth resistor is 3R REF , the resistance of the sixth resistor is R REF, the sixth switch K6 and the tenth switch K10 are closed, and the output terminal of the auxiliary operational amplifier AMP is fed back; at the same time, the third switch K3 and the fourth switch are closed. At the same time, the voltages of the sixth voltage and current source VI_6 and the seventh voltage and current source VI_7 are changed, so that the input terminal of the operational amplifier DUT under test is equivalently obtained with a common mode voltage Vi. For...

Embodiment 2

[0095] See Figure 4 , this embodiment mainly detects the rising edge slew rate Sr+ of the operational amplifier DUT to be tested, that is, the maximum change rate of the rising edge of the output voltage over time when a specified large signal step pulse voltage is applied to the input terminal. In this embodiment, the seventh switch and the ninth switch K9 are closed, and the output terminal of the operational amplifier DUT to be tested is introduced into feedback; at the same time, the blade of the first switch K1 is grounded, and the second switch K2 is electrically connected to the voltage and current source node, receiving the programmed trip voltage. At this time, the rising edge amplitude change ΔV1 and the corresponding change time Δt1 of the output voltage at the output terminal of the operational amplifier DUT to be tested are detected. According to the calculation formula, the rising edge slew rate Sr+=ΔV1 / 1 is obtained.

Embodiment 3

[0097] See Figure 5 , this embodiment mainly detects the falling edge slew rate Sr- of the operational amplifier DUT to be tested, that is, the maximum change rate of the falling edge of the output voltage over time when a specified large-signal step pulse voltage is applied to the input terminal. In this embodiment, the seventh switch and the ninth switch K9 are closed, and the output terminal of the operational amplifier DUT to be tested is introduced into feedback; at the same time, the blade of the first switch K1 is grounded, and the second switch K2 is electrically connected to the voltage and current source node, receiving the programmed trip voltage. At this time, the output voltage falling edge amplitude change ΔV2 and the corresponding change time Δt2 at the output terminal of the operational amplifier DUT to be tested are detected. According to the calculation formula, the falling edge slew rate Sr+=ΔV2 / 2 is obtained.

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Abstract

The invention relates to an operational amplifier test circuit and system. The operational amplifier test circuit comprises a first voltage current source, a second voltage current source, a first input unit, a second input unit and an operational amplifier to be tested. The first voltage current source and the second voltage current source respectively provide a pulse edge voltage signal and a common mode / differential mode voltage for a signal source node P, the first input unit outputs the common mode / differential mode voltage or a low level voltage signal to a negative input end of the operational amplifier to be tested, and the second input unit outputs a program-controlled jump voltage or the low level voltage signal to a positive input end of the operational amplifier to be tested,wherein the program-controlled jump voltage is formed by combining the common mode / differential mode voltage and the pulse edge voltage signal, so that the second voltage current source is multiplexedin a test process, the number of voltage and current sources of the operational amplifier test circuit is reduced, and the test cost is further reduced.

Description

technical field [0001] The invention relates to the technical field of semiconductor integrated circuit testing, in particular to an operational amplifier testing circuit and system. Background technique [0002] At present, before the operational amplifier is put into the application process of the integrated circuit, it is usually necessary to test the multi-parameters of the operational amplifier. In the process of testing each parameter, it is necessary to provide a test circuit. In this way, multiple test circuits are required. , The operational amplifier needs to frequently replace the test circuit, which is more troublesome for the testers. At the same time, due to the frequent replacement of the operational amplifier test circuit, it will cause damage to the operational amplifier, and the test efficiency is not high. [0003] In order to improve the test efficiency, currently in the mass production test of the operational amplifier, it is necessary to use the auxilia...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2851
Inventor 姜祎春袁琰
Owner BEIJING HUAFENG TEST & CONTROL TECH CO LTD