A three-dimensional measurement method of structured light based on spatial binary coding
A technology of binary coding and three-dimensional measurement, which is applied in measuring devices, optical devices, image analysis, etc., and can solve problems such as unfavorable real-time online measurement
Active Publication Date: 2021-04-20
ANHUI AGRICULTURAL UNIVERSITY
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However, these methods generally require additional projection of three or more coded stripes, which is not conducive to real-time online measurement
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[0042] The present invention will be described in detail below, and the technical solutions in the embodiments of the present invention will be clearly and completely described. Apparently, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0043] The present invention provides a structured light three-dimensional measurement method based on spatial binary coding through improvement, such as Figure 1-Figure 7 shown, including the following steps:
[0044] Step S1: Using a computer to generate three sinusoidal phase shift fringes according to the three-step phase shift algorithm, and generate a spatial binary coded fringe according to the principle of spatial binary coding;
[0045] The principle of spatial binary en...
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The present invention relates to the technical field of three-dimensional measurement of structured light, specifically a method for three-dimensional measurement of structured light based on spatial binary coding, step S1: using a computer to generate three sinusoidal phase shift stripes and one spatial binary coding stripe; step S2: Use a projector to project all the fringe images onto the surface of the measured object in sequence, and collect all the modulated fringe images synchronously through the camera; Step S3: Send all the collected fringe images to the computer, and calculate the truncated phase φ of the sinusoidal phase shift fringe (x, y), step S4: determine the fringe order k(x, y) corresponding to each fringe period T one by one; step S5: perform phase unwrapping operation on the truncated phase φ(x, y); calculate the measured The absolute phase ψ(x, y) of the object reconstructs the three-dimensional shape information of the measured object. The invention only needs one coded fringe to realize phase unwrapping, and the measurement speed is faster, and at the same time, it can effectively avoid truncating the phase and fringe Order of non-alignment error, higher accuracy and robustness.
Description
technical field [0001] The invention relates to the technical field of structured light three-dimensional measurement, in particular to a structured light three-dimensional measurement method based on spatial binary coding. Background technique [0002] Structured light three-dimensional measurement technology has the advantages of non-contact, high precision, fast speed, and simple structure, and is widely used in industrial inspection, biomedicine, agricultural engineering and other fields. A structured light 3D measurement system generally includes three parts: a projector, a camera, and a computer. The measurement process is as follows: first, the projector projects the fringe pattern onto the surface of the object to be measured, and the camera synchronously collects the deformed fringe image; then the computer processes the fringe image The fringe analysis recovers the absolute phase of the object; according to the principle of triangulation, the absolute phase is mapp...
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IPC IPC(8): G01B11/25G06T7/521
CPCG01B11/2527G06T7/521
Inventor 王玉伟刘路陈向成王亚军
Owner ANHUI AGRICULTURAL UNIVERSITY