Wheat scab detection method based on multi-angle field high-definition imaging

Abstract

The invention particularly relates to a wheat scab detection method based on multi-angle field high-definition imaging. The method comprises the following steps: (A), arranging a loosening frame in ato-be-detected area of a field, and enabling wheat ears to pass through grid holes of the loosening frame; (B), starting a shooting unit, and collecting M multi-angle wheat ear images; (C), processingthe M wheat ear images, identifying wheat ears in the images and grids corresponding to the wheat ears to obtain a wheat ear area and a disease infection area of each wheat ear in each wheat ear image so as to calculate wheat ear disease severity; and (D), calculating an nth wheat ear disease severity mean value. With multi-angle shooting, a phenomenon of inaccurate results caused by shielding ofwheat ears at a certain angle can be avoided; for matching of same wheat ears in multi-angle pictures, the wheat ears are segmented by the loosening frame, so that the high accuracy and the processing speed of subsequent wheat ear matching are guaranteed. Meanwhile, the wheat ears become tidy and the shot picture processing effect is optimized.

Description

technical field [0001] The invention relates to the technical field of crop disease detection, in particular to a method for detecting wheat scab based on multi-angle field high-definition imaging. Background technique [0002] Wheat head blight is one of the main diseases of wheat, which occurs widely all over the world, mainly in wheat areas such as the middle and lower reaches of the Yangtze River, Jianghuai, Huanghuai, and southern North China. In particular, temperate regions with humid and rainy climates are severely affected. The year of wheat scab can cause the loss of wheat yield by 10%-30%, and the year of severe disease can reach 70%-80%, or even no harvest. The disease not only affects the yield of wheat, but the pathogenic bacteria remain in the diseased grains and produce toxins such as deoxynivalenol (DON), which seriously affects the quality of wheat and the health of humans and animals. Therefore, early detection of the wheat scab incidence area in the fie...

AI Technical Summary

Problems solved by technology

However, in the outdoor field environment, due to the uneven sunlight, the wheat growth environment is more complicated, and there are many uncertain factors such as high / multi-spectrum data, the angle between the lens of the digital camera and the sun rays, and wind speed, etc., the incidence of wheat head blight The diagnostic accuracy is still low, and the identification efficiency of disease severity is not high

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