Integrated circuit pin clamping abnormality detection and protection device

Abstract

The invention discloses an integrated circuit pin clamping abnormality detection and protection device. The device comprises a detection relay, an AC signal generation circuit, a rectification filtercircuit, an adjustable voltage reference circuit, a comparison circuit, a self-locking circuit, a clamping abnormality driving circuit, a clamping abnormality alarm circuit, a clamping normality driving circuit, a clamping normality indication circuit, a test power supply, a power supply relay and a power supply delay driving circuit. When pins of an integrated circuit are clamped normally and abnormally, reactance between the pins is different, the influences of different reactance on a detection signal are different, therefore, the influence of the reactance between the pins of the integrated circuit on the detection signal is used for detecting the clamping condition of a test fixture on the pins of the integrated circuit, so the judgment and detection of an abnormal clamping conditionare realized, the test power supply applied to the integrated circuit is cut off in case of abnormality, and therefore, the protection of the integrated circuit is realized.

Description

Technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to an integrated circuit pin clamping abnormality detection and protection device. Background technique [0002] Integrated circuit testing plays a very important role in the development, production and use of integrated circuits, and it is very necessary to achieve reliable testing of integrated circuits. [0003] When testing an integrated circuit, if the pins of the integrated circuit and the test fixture are not in good contact, the test results will be unreliable in the slightest, and the integrated circuit will be damaged in the worst case. Currently, there is no technical method to judge the situation of the IC pin clamped by the test fixture. It is only judged according to the test results after inserting and unplugging the integrated circuit from the test fixture several times. This method is very inconvenient, low in efficiency, and sometimes leads to integrati...

AI Technical Summary

Problems solved by technology

[0003] When testing an integrated circuit, if the contact between the pins of the integrated circuit and the test fixture is not good, the light will lead to unreliable test results, and the severe one will cause damage to the integrated circuit

At present, there is no technical way to judge the situation of the test fixture clamping the integrated circuit pins. It is only judged according to the test results after inserting and unplugging the integrated circuit from the test fixture many times. This method is very inconvenient, low in efficiency, and sometimes causes integration problems. circuit damage

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