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LED array junction temperature measurement method, device and system

A technology of LED array and measurement method, which is applied in the direction of measuring devices, measuring heat, thermometers, etc., can solve the problems of large error and high cost of junction temperature, and achieve the effects of low cost, improved accuracy, and simple hardware structure

Inactive Publication Date: 2020-02-25
CHANGZHOU INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] In order to solve the problem of high cost and large error in measuring LED junction temperature in the prior art, the present invention provides a method for measuring LED array junction temperature, which can reduce cost and error

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  • LED array junction temperature measurement method, device and system
  • LED array junction temperature measurement method, device and system
  • LED array junction temperature measurement method, device and system

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Embodiment Construction

[0038] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0039] figure 1 It shows a method for measuring the junction temperature of an LED array provided by an embodiment of the present invention. Before starting to measure the junction temperature of the LED, first select the connection mode of the LED lamp beads in the LED array and the number of LED lamp beads in the LED array through the button module. N and the current value of the input power supply of the LED array. In this embodiment, the power supply of th...

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Abstract

The invention relates to LED array junction temperature measurement, and particularly discloses an LED array junction temperature measurement method, device and system. The device comprises an information acquisition module and a calculation module; the information acquisition module is used for acquiring voltage values VF and current values IF of both ends of an LED array, a connection mode of LED lamp beads in the LED array and a number N of the LED lamp beads in the LED array; and the calculation module is used for calculating a resistance value R of the LED array and calculating a junctiontemperature value of the LED array according to a linear relationship between the resistance value R and a junction temperature T and an LED resistance temperature coefficient. According to the LED array junction temperature measurement method, device and system, investment cost of LED junction temperature measurement equipment can be reduced and a measurement temperature difference can be reduced.

Description

technical field [0001] The invention relates to the field of LED junction temperature measurement, in particular to a method, device and system for measuring the junction temperature of an LED array. Background technique [0002] When the LED array is working, the junction temperature will increase due to the self-heating effect, which will lead to adverse consequences such as decreased luminous efficiency, light decay, and reduced life. Therefore, it is very necessary to measure the junction temperature of the LED array in a timely and accurate manner and take good heat dissipation measures. [0003] The existing LED junction temperature measurement methods mainly include optical measurement method, thermal resistance measurement method, electrical parameter measurement method and so on. Among them, the optical measurement method is separated from the actual working environment of the LED chip, and the required measurement equipment is expensive; the measurement of the ther...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26G01K13/00
CPCG01R31/2635G01K13/00
Inventor 褚静
Owner CHANGZHOU INST OF TECH