Method and system for predictive maintenance of integrated circuits

Abstract

The invention relates to a method for predictive maintenance of electronic components and an associated system. The electronic device to be maintained is implemented as an integrated circuit. For this purpose, the electronic component to be maintained has sensors at at least one location, which determine current values ​​of system parameters and signal transit times at at least one location during continuous operation. A central monitoring unit installed in the electronics interrogates the values ​​currently determined by sensors at at least one location for system parameters and signal transit times. The central monitoring unit then determines a correspondingly valid limit value for the signal transit time at at least one location as a function of the currently determined value of the system parameter and converts the currently determined signal transit time at the at least one location to The times are compared with the corresponding valid limit values. If the current signal transit time exceeds this limit value, a report is sent to a higher-level layer.

Description

technical field [0001] The present invention relates generally to electronic systems and circuits, and particularly to the field of integrated circuits such as application specific integrated circuits (ASICs) and field programmable gate arrays (FPGAs). In particular, the invention relates to a method for predictive maintenance of electronic devices implemented as integrated circuits, in particular as ASICs or FPGAs. The electronic device has sensors at at least one location from which system parameters and signal transit times are determined during operation of the electronic device at the at least one location. Furthermore, the invention also relates to an associated system for predictive maintenance of electronic components. Background technique [0002] In many complex systems, such as control and regulation systems for machines and installations, computer systems, production facilities, vehicles and aircraft, propulsion, etc., especially in the case of safety-critical a...

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Problems solved by technology

[0009] However, this approach has the disadvantage that manufacturer data for integrated circuits, such as maximum failure rates, etc. are usually based on average or median values ​​of, for example, reliability tests and / or stress tests at elevated temperatures and / or voltages, etc.

However, in the case of this method, a relatively and possibly time-consuming and cost-intensive analysis is required due to the large amount of information

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