Method and system for predictive maintenance of integrated circuits

Abstract

The invention relates to a method for the predictive maintenance of electronic components (BE) and to an associated system. The electronic components (BE) to be maintained are in the form of integrated circuits, in particular application-specific integrated circuits (ASICs) or what are known as field-programmable gate arrays (FPGAs). For this purpose, an electronic component (BE) to be maintainedhas sensors (T1, U1, LZ1, T2, U2, LZ2) at at least one position (P1, P2), by means of which sensors present values of system parameters, such as temperature and voltage, and of a signal propagation time at the at least one position (P1, P2) are determined during operation. The values of the system parameters and of the signal propagation time presently determined by the sensors (T1, U1, LZ1, T2, U2, LZ2) at the at least one position (P1, P2) are retrieved (1) by a central monitoring unit (UW) installed in the electronic component (BE). By means of the central monitoring unit (UW), an individual valid limit value is then determined for the signal propagation time at each of the at least one position (P1, P2) on the basis of the presently determined values of the system parameters and the presently determined signal propagation time at each of the at least one position (P1, P2) is compared (2) with the associated valid limit value. If the present signal propagation time exceeds the limitvalue, a notification is sent (3) to a superordinate level (GS), such as the overall system, in order, for example, to trigger an early replacement of the electronic component (BE) and thus to prevent error states and failures.

Description

technical field [0001] The present invention relates generally to the field of electronic systems and circuits, and more particularly to the field of integrated circuits, such as application-specific integrated circuits (ASICs) and field-programmable gate arrays (FPGAs). In particular, the invention relates to a method for predictive maintenance of electronic devices implemented as integrated circuits, in particular ASICs or FPGAs. The electronic component has sensors at at least one location, from which system parameters and signal transit times are determined at the at least one location during operation of the electronic component. Furthermore, the invention also relates to an associated system for predictive maintenance of electronic components. Background technique [0002] In many complex systems, such as control and regulation systems for machines and installations, computer systems, production facilities, vehicles and aircraft, propulsion plants, etc., especially in...

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Problems solved by technology

[0009] However, this approach has the disadvantage that manufacturer data for integrated circuits, such as maximum failure rates, etc. are usually based on average or median values ​​of, for example, reliability tests and / or stress tests at elevated temperatures and / or voltages, etc.

However, in the case of this method, a relatively and possibly time-consuming and cost-intensive analysis is required due to the large amount of information

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