A method and system for extracting lines from an array image of a liquid crystal panel

Abstract

The invention discloses a method and system for extracting lines of an array image of a liquid crystal panel, comprising: making a line template diagram according to the pattern of each product; obtaining the feature points of the input image X corresponding to the product A, and obtaining the features of the input image X Figure M; obtain the feature points of the line template map B corresponding to the product A, and obtain the feature map N of the line template map B based on the extracted feature points; match the feature map M and the feature map N, and obtain the M in N based on the matching result Position, based on the relative position of feature map M and feature map N, obtain the position of all lines in the input image X. By accurately judging the position of the circuit in the image, combined with the position of the defect in the image, this method realizes the accurate determination of the short circuit and open circuit of the circuit, improves the accuracy and efficiency of defect discovery, reduces the risk of defects entering the next link, and improves the product quality of the production line. Yield, saving the labor cost of drawing judgment.

Description

technical field [0001] The invention relates to the field of image processing, in particular, to a method and system for extracting a line of an array image of a liquid crystal panel. Background technique [0002] The front-end array process of liquid crystal panel manufacturing is one of the extremely important processes in the liquid crystal panel manufacturing process, including four parts: thin film, yellow light, etching, and film stripping. [0003] At present, there will be a large number of defects in the array process of LCD panels. The two most important and influential types of defects are intersection defects and wire breakage defects. Intersection defects refer to defects in specific materials (such as metal residues, etc.) that fall on two lines. In between, resulting in a short circuit of the line; a disconnection defect refers to a specific type of defect (such as a hole, etc.) falling on the line, causing the line to open. These two types of defects will di...

AI Technical Summary

Problems solved by technology

The existing production line AOI inspection system cannot calculate whether the defects lead to line intersection or disconnection because it cannot judge the line position of the image. It can only be judged manually, which is inefficient and has a high error rate.

Images