Non-contact wide-temperature-difference infrared temperature measurement method

An infrared temperature, non-contact technology, used in radiation pyrometry, measuring devices, optical radiation measurement, etc., can solve the problems of inaccurate measurement accuracy, temperature measurement failure, narrow temperature measurement range, etc., to achieve temperature measurement accuracy High, fast tracking measurement, wide temperature range effect

Inactive Publication Date: 2020-04-17
TIANJIN JINHANG INST OF TECH PHYSICS
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Problems solved by technology

[0002] In recent years, products related to non-contact temperature measurement have been favored by everyone in the market, but non-contact temperature measurement products on the market are easily affected by the following aspects, resulting in inaccurate measurement accuracy: (1) Sensitivity: detector Long response time, slow response, unable to measure temperature in real time; (2) target size: if the target is too small, it is easy to cause the temperature measurement product to fail to detect the target and cause temperature measurement failure; (3) temperature measurement range: the temperature measurement range is narrow and cannot be realized Measure the temperature range of wide temperature difference; (4) Environmental conditions: unable to adapt to a wide range of ambient temperature ranges

Method used

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  • Non-contact wide-temperature-difference infrared temperature measurement method

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Embodiment 1

[0050] The working environment temperature range of the technical solution of this embodiment is 0°C to 40°C, the temperature measurement range is 5°C to 300°C, and the temperature measurement accuracy is required to be ±2°C (100°C), Due to the wide temperature measurement range, fixing a detector configuration (including integration time length, integration capacitance, GSK setting) will cause the imager to be saturated in the face of a higher temperature scene, and the detector configuration is divided into normal temperature segments according to the temperature measurement range configuration (5°C-80°C), sub-high temperature section configuration (80°C-200°C), and high-temperature section configuration (200°C-300°C). In the normal temperature scene, it is necessary to adjust the parameters of the detector to ensure that the imager has a higher temperature resolution and a better NETD index. In the face of a sub-high temperature scene, the integration time is shortened by se...

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Abstract

The invention belongs to the technical field of temperature measurement, and particularly relates to a non-contact wide-temperature-difference infrared temperature measurement method, which comprisesthe following steps of: setting a measurement system, and arranging a black body, a detector, an imager and an optical window in an incubator; configuring the detector according to the temperature measurement range; changing the temperature of the black body at different environment temperatures, finding out the relation between gray scale output of the imager and the temperature of the focal plane at the same temperature of the black body, and obtaining a gray scale-focal plane temperature fitting curve; during actual temperature measurement, according to the current focal plane temperature,substituting the current focal plane temperature into the gray-focal plane temperature fitting curve to obtain to-be-fitted gray output corresponding to different black body temperatures; and fittinga gray-temperature curve in real time according to the plurality of to-be-fitted gray output and the calibration blackbody temperature, and substituting the current pixel gray into the curve to obtainfinal temperature measurement temperature output. The method is high in temperature measurement speed and high in sensitivity, the response speed of an infrared thermometer to the temperature is very high, and real-time and rapid tracking measurement can be carried out.

Description

technical field [0001] The invention belongs to the technical field of temperature measurement, and in particular relates to a non-contact wide temperature difference infrared temperature measurement method. Background technique [0002] In recent years, products related to non-contact temperature measurement have been favored by everyone in the market, but non-contact temperature measurement products on the market are easily affected by the following aspects, resulting in inaccurate measurement accuracy: (1) Sensitivity: detector Long response time, slow response, unable to measure temperature in real time; (2) target size: if the target is too small, it is easy to cause the temperature measurement product to fail to detect the target and cause temperature measurement failure; (3) temperature measurement range: the temperature measurement range is narrow and cannot be realized Measure the temperature range of wide temperature difference; (4) Environmental conditions: cannot...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/00G01J5/08
CPCG01J5/00G01J5/0887G01J5/80
Inventor 刘冰马群
Owner TIANJIN JINHANG INST OF TECH PHYSICS
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