Reduced dimensionality structured illumination microscopy with patterned arrays of nanowells
A patterning and patterning technology, applied in nanotechnology, nanotechnology, nanotechnology for sensing, etc.
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[0041] As used herein, with respect to diffracted light emitted by a diffraction grating, the term "order" or "order" is intended to mean the number of integer wavelengths representing the number of wavelengths from adjacent slits of the diffraction grating for constructive interference. The path length of light is poor. The term "zeroth order" or "zeroth order maximum" is intended to refer to the central bright fringe emitted by the diffraction grating where there is no diffraction. The term "first order" is intended to refer to the two bright fringes emitted on either side of the zero order fringe, where the path length difference is ±1 wavelength.
[0042] As used herein, with respect to a sample, the term "spot" or "feature" is intended to mean a point or region in a pattern that can be distinguished from other points or regions by relative position. Individual spots may include one or more molecules of a particular type. For example, a spot may comprise a single target ...
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