The application discloses a kind of
structure light illumination super-resolution
microscopic imaging methods based on four-beam interference.The method uses four-beam coherent interference illumination design, and combines the composite
frequency domain filtering strategy based on three-dimensional OTF physical constraint, under the premise that no need to carry out any hardware modification to the light path of traditional interference
structure light microscope (SIM)
system, first realize the lateral two times super-
resolution improvement and excellent
optical sectioning ability, effectively overcome the off-focus background
interference problem faced in thick sample imaging in the prior art.In addition, the application introduces an illumination parameter
estimation algorithm based on
principal component analysis (PCA), while significantly reducing the computational complexity, further improves the accuracy and stability of parameter
estimation.Experimental results show that the method can high-resolution, high-fidelity, high-robustness and high-efficiency imaging for thick
living cell samples, break through the limitation that traditional two-dimensional super-resolution SIM is mainly suitable for thin
living cell imaging, has wide application potential and practical value.