Structured illumination microscopy with line scanning
A line-scanning, axis-based technology, used in microscopes, laboratory containers, nanotechnology, etc.
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[0037]As used herein, with respect to diffracted light emitted by a diffraction grating, the term "order" or "order" is intended to mean the number of integer wavelengths representing the number of light coming from adjacent slits of the diffraction grating that constructively interfere. The path length is poor. The term "zeroth order" or "zeroth order maximum" is intended to refer to the central bright fringe emitted by a diffraction grating in which there is no diffraction. The term "first order" is intended to refer to two bright fringes emitted on either side of the zero order fringe, where the path length difference is ±1 wavelength.
[0038] As used herein, with respect to a sample, the term "spot" or "feature" is intended to mean a point or region in a pattern that can be distinguished from other points or regions by relative position. Individual spots may include one or more molecules of a particular type. For example, a spot may comprise a single target nucleic acid...
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