Three-dimensional outline measuring method based on Structured Illumination Microscopy
A measurement method and three-dimensional contour technology, which is applied in the field of image recognition, can solve problems such as lack of information, distortion of three-dimensional contour edges, and limited application range
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[0054] Preferred embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings.
[0055] In order to achieve the purpose of the present invention, in some embodiments of a three-dimensional profile measurement method based on structured illumination microscopy, a three-dimensional profile measurement method based on structured illumination microscopy specifically includes the following steps:
[0056]Step 1, using the three-dimensional surface shape measurement method to obtain the three-dimensional surface shape distribution point cloud data of the measured object;
[0057] Step 2, using the structured light illumination method to obtain a two-dimensional plane image of the measured object;
[0058] Step 3, performing image processing on the two-dimensional planar image obtained in step 2 to obtain the super-resolution edge profile of the measured object;
[0059] In step four, the 3D surface distribution point cloud dat...
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