Conductive contact and anisotropic conductive sheet having same
An anisotropic, conductive contact technology, applied to parts of electrical measuring instruments, measuring electricity, measuring electrical variables, etc., can solve the problems of anisotropic conductive sheet 10, such as the decline in electrical characteristics, mechanical characteristics, and short life, to achieve Enhanced electrical conductivity, improved electrical conductivity, and the effect of preventing lifespan decline
Active Publication Date: 2022-06-03
SAE HAN MICRO TECH
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Problems solved by technology
Therefore, there is a problem that, after performing a plurality of inspections, the spherical conductive particles 12 are detached from the contact portion 11 and the electrical and mechanical properties of the anisotropic conductive sheet 10 are degraded.
That is, the conventional anisotropic conductive sheet 10 has a problem of short life
Method used
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[0040] Hereinafter, embodiments of the present invention will be described in detail with reference to the accompanying drawings. However, the present invention can be realized in various forms, and is not limited to the embodiments disclosed below, and these embodiments are only for the purpose of completely revealing the present invention and fully explaining the invention to those skilled in the technical field of the present invention. range provided. The same symbols in the figures denote the same elements.
[0041] image 3 It is a figure which shows the anisotropic conductive sheet of one Example of this invention.
[0042] The anisotropic conductive sheet 100 serves to electrically connect the contact pads 4 of the inspection device 3 and the terminals 2 of the semiconductor element 1 . The anisotropic conductive sheet 100 has conductivity in the thickness direction at positions corresponding to the contact pads 4 of the inspection device 3 and the terminals 2 of th...
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Abstract
The present invention relates to an anisotropic conductive sheet used for testing sockets and the like for inspecting semiconductor elements, and more specifically, the present invention relates to an anisotropic conductive sheet including a plurality of contact portions and insulating portions. The plurality of contact portions includes conductive springs and conductive powder, and the insulating portion insulates adjacent contact portions and supports the contact portions. The present invention provides an anisotropic conductive sheet disposed between a component to be inspected and an inspection device, and electrically connecting terminals of the component and contact pads of the inspection device to each other. The anisotropic conductive sheet includes: a plurality of contact portions arranged at positions corresponding to the terminals of the above-mentioned elements and the contact pads of the inspection device, and having conductivity in the thickness direction; and an insulating portion that insulates adjacent contact portions from each other. , and supports the contact part. In addition, the contact part includes: an elastic matrix; a conductive spring disposed in the elastic matrix; and a plurality of conductive particles arranged along the thickness direction of the elastic matrix. The present invention is characterized in that the conductive particles are arranged at a higher density in the peripheral portion of the wire constituting the conductive spring than in the central portion of the elastic matrix. In the present invention, conductive particles are arranged concentratedly on the peripheral portion of the wire constituting the conductive spring, thereby having the advantages of reducing the amount of conductive particles and improving the conductivity of the contact portion.
Description
technical field [0001] The present invention relates to an anisotropic conductive sheet used for testing sockets and the like for testing semiconductor elements, etc., and more specifically, the present invention relates to an anisotropic conductive sheet including a plurality of contact portions and insulating portions In the sheet, the plurality of contact portions include conductive springs and conductive powder, and the insulating portion insulates adjacent contact portions and supports the contact portions. Background technique [0002] After a semiconductor element is manufactured, a performance inspection of the manufactured semiconductor element is required. When inspecting a semiconductor element, it is necessary to use a test socket for electrically connecting the contact pads of the inspection device and the terminals of the semiconductor element. [0003] In a test socket, a test socket including a contact portion with conductive powder arranged along the longit...
Claims
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IPC IPC(8): G01R1/073G01R1/04G01R1/067
CPCG01R1/04G01R1/067G01R1/073G01R1/0735G01R1/0483G01R1/06716G01R1/06722
Inventor 田仲秀白炳善金锡民
Owner SAE HAN MICRO TECH