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Standardized 3D information acquisition and measurement method and system

A technology of information measurement and information collection, applied in the field of measurement, can solve the problems of unresolved, big data collection and utilization problems, and achieve the effect of improving synthesis accuracy, facilitating subsequent processing and utilization, and fast speed.

Active Publication Date: 2020-05-15
天目爱视(北京)科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the current existing technology only proposes a general 3D acquisition method, does not involve how to carry out standardized collection, and does not propose from which angles to carry out standardization, which brings troubles to the collection and utilization of big data

Method used

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  • Standardized 3D information acquisition and measurement method and system
  • Standardized 3D information acquisition and measurement method and system
  • Standardized 3D information acquisition and measurement method and system

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Embodiment Construction

[0048]Exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited by the embodiments set forth herein. Rather, these embodiments are provided for more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0049] Arrange the target object (such as a person to be captured) in front of the background board. The background board can choose a solid color background or a regular pattern background to facilitate the extraction of subsequent image edges and improve computing speed.

[0050] Set light source parameters such as light intensity and color temperature, so that the light conditions are standardized conditions.

[0051] Set multipl...

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Abstract

The invention provides a standardized 3D information acquisition and measurement method and system, and the method comprises the steps: adjusting the position of a target object according to a presetmark, and enabling the preset features of the target object to be aligned with the mark; collecting a plurality of images of the target object at a plurality of positions, wherein the interval betweentwo adjacent positions in the plurality of positions is within a predetermined range; segmenting the plurality of images to obtain a plurality of preprocessed images containing target object predetermined information; and synthesizing the 3D information of the target object by utilizing the plurality of preprocessed images. According to the invention, standardization of acquisition required in the field of 3D acquisition and synthesis, especially in the field of synthesizing 3D by using pictures shot at multiple positions, is proposed for the first time, i.e., a certain specification is required to be specified for acquisition and synthesis, so that the acquisition and synthesis precision is higher, the speed is higher, the acquired data is more orderly, and subsequent processing and utilization are facilitated.

Description

technical field [0001] The invention relates to the technical field of measurement, in particular to the technical field of measuring the length and shape of an object by a standardized method. Background technique [0002] When measuring an object, mechanical methods (such as a scale), electromagnetic methods (such as an electromagnetic encoder), optical methods (such as a laser rangefinder), and image methods are generally used. However, at present, the method of synthesizing 3D point cloud data of an object by using multiple images is rarely used, and then measuring the length and shape of the object. Although this method can measure any size of the object after obtaining the 3D information of the object, there is a technical bias in the field of measurement: it is believed that such a measurement method is complicated, the measurement speed is not fast, and the accuracy is not high. The main reason is that the optimization of the synthesis algorithm is not enough. in pl...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06K9/00G01B11/24
CPCG01B11/24G06V40/107G06V40/161G06V40/18
Inventor 左忠斌左达宇
Owner 天目爱视(北京)科技有限公司
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