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Method and apparatus for detecting a pulsed thz beam with time of flight correction

A technology for detecting pulses and time-of-flight, which is used in measuring devices, material inspection products, and material analysis through optical means.

Active Publication Date: 2020-05-26
ABB (SCHWEIZ) AG
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0010] In many real world applications, measured THz signals have proven to have limited accuracy and reproducibility

Method used

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  • Method and apparatus for detecting a pulsed thz beam with time of flight correction
  • Method and apparatus for detecting a pulsed thz beam with time of flight correction
  • Method and apparatus for detecting a pulsed thz beam with time of flight correction

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Embodiment Construction

[0032] Reference will now be made in detail to various embodiments, one or more examples of which are illustrated in each figure. Each example is provided by way of explanation, and is not meant as a limitation. For example, features illustrated or described as part of one embodiment can be used on or in conjunction with any other embodiment to yield a still further embodiment. It is intended that the present disclosure includes such modifications and variations.

[0033] Within the following description of the drawings, the same reference numerals refer to the same or similar components. Generally, only the differences with respect to the various embodiments are described. Unless otherwise specified, descriptions of a part or aspect in one embodiment are also applicable to corresponding parts or aspects in another embodiment.

[0034] refer to Figure 1-3 , an embodiment of the detection device is now described.

[0035] figure 1 is a schematic side view showing the ba...

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Abstract

A method and an apparatus for detecting a pulsed THz beam comprise: emitting, by THz emitter (10), pulsed THz radiation (60) of outgoing pulse shape for interacting with target body; detecting, by THzdetector (20), incoming THz radiation comprising THz pulses, and outputting, by THz detector (20), a raw detector data of pulse shapes of incoming THz pulses; and determining, by pulse shape reconstruction module (36), a reconstructed incoming pulse shape based on the raw detector data, measuring, by sensor (80), a time-of-flight quantity (d) affecting the time of flight of the THz radiation (60); and adjusting operation of at least one of THz emitter (10), THz detector (20) and pulse shape reconstruction module (36) using the time-of-flight quantity (d), for correcting for variations in timeof flight of the THz radiation (60).

Description

technical field [0001] Aspects of the invention relate to a method of detecting a pulsed THz beam, wherein THz radiation is emitted by a THz transmitter, travels to a target subject to be inspected, interacts with the target subject, travels to a THz detector, And detected in the time domain by a THz detector, eg for material inspection. Further aspects of the invention relate to a coating method for coating a body, and to corresponding equipment and coating installations. Background technique [0002] Methods based on THz radiation have been proposed for various purposes such as material testing and quality control applications. For example, JP 2004028618 A and EP 2213977 A1 describe corresponding methods for determining the thickness of paint films using THz radiation. [0003] In particular, THz time-domain spectroscopy is expected to be used for early and automated quality control of coatings (eg, paint films of vehicle bodies painted during production) in a contactles...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/3586
CPCG01N21/3586G01N33/32G01N2201/06113G01N2201/0697
Inventor D.马斯B.拉迪萨夫耶维奇M.波鲁斯J.L.M.范梅赫伦
Owner ABB (SCHWEIZ) AG
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