A psg adjustment and testing method for improving steady state of mwt solar cells
A technology of solar cells and testing methods, applied in the monitoring, circuit, photovoltaic power generation of photovoltaic systems, etc., can solve the problems affecting the reliability of the component end, lack of solutions and monitoring methods, steady-state instability, etc., to improve the hot spot and Reliability issues, avoiding poor process batches, preventing and improving steady state effects
Active Publication Date: 2021-05-18
徐州谷阳新能源科技有限公司
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Problems solved by technology
[0004] At present, the stable state after printing is unstable, which affects the reliability of the component side, and there is no effective solution and monitoring method
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[0021] The present invention will be further explained below in conjunction with the accompanying drawings and specific embodiments.
[0022] Such as Figure 1-2 As shown, the present embodiment provides a PSG adjustment and testing method for improving the steady state of a MWT solar cell, which is characterized in that it includes the following two aspects:
[0023] 1) Test method:
[0024] The first step is to take the silicon wafer after etching, that is, the back side is alkali-polished, and divide the 1 / 2 position of the hole into 2 pieces on average along the position of the hole;
[0025] The second step is to place the hole position under a 3D microscope, use a 5x objective lens, and find the side position of the hole with a light brightness of 26%-30%;
[0026] The third step is to move the punching position to the center of the cursor;
[0027] The fourth step is to adjust the objective lens 50 times, the brightness of the light is 12%-16%, and the test mode is Z...
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The invention discloses a PSG adjustment and test method for improving the steady state of MWT solar cells, including two aspects of the test method and the adjustment method. The first step is to take the silicon wafer after etching, that is, the backside alkali polishing, and follow the position of the hole Divide the 1 / 2 position of the hole into 2 evenly; the second step is to place the hole position under a 3D microscope, use a 5x objective lens, and the light brightness is 26%-30% to find the side position of the hole; the third step is to divide the hole position Move to the center of the cursor; step 4, adjust the objective lens 50 times, light brightness 12%-16%, test mode Zeta 3D mode to test the 3D image in the hole; step 5, select the straight line, pull the overcut length in the hole and the silicon wafer Thickness; the sixth step is to calculate the overcut ratio in the hole, the overcut ratio in the hole = the length of the overcut / the thickness of the silicon wafer, and the overcut ratio in the control hole is 0-50% of the cross-sectional area of the silicon wafer.
Description
technical field [0001] The invention relates to a PSG adjustment and testing method for improving the steady state of MWT solar cells, and belongs to the technical field of MWT solar cell component processing. Background technique [0002] Metal-wrapped silicon solar cells (MWT) have attracted more and more attention because of their high efficiency, small shading area, better appearance characteristics, and ease of integration with existing traditional crystalline silicon processes. MWT silicon solar cells use laser drilling to transfer the energy collected from the front through the cell to the back of the cell to reduce the shading area and improve conversion efficiency. [0003] The etching and cleaning process is very important, and the retention of the PN junction in the hole is very important in the preparation process of the MWT battery. The retention of the PN junction can reduce the technical requirements and development difficulty of the plugging slurry, reduce th...
Claims
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IPC IPC(8): H01L31/18
CPCH01L21/30604H01L31/18H02S50/10Y02E10/50Y02P70/50
Inventor 段帅华邢飞史修江夏中雪
Owner 徐州谷阳新能源科技有限公司