Atomic layer deposition technology and method used for preparing iridium thin film

An atomic layer deposition and thin film technology, applied in coating, metal material coating process, gaseous chemical plating, etc., can solve the problems of blocked valve and high production cost, achieve easy operation, good step coverage, good deposition process Effect

Pending Publication Date: 2020-06-09
江苏迈纳德微纳技术有限公司
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The deposited elemental film has excellent uniformity and good step coverage; it is better than plasma NH3, hydrogen and other gases reported in the literature; it is more convenient, safer and easier to operate during use; it can avoid plasma hydrogen and plasma ammonia It can simplify the p

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] A kind of with 1-ethylcyclopentadienyl-1 as liquid iridium source precursor, with anhydrous hydrazine reducing agent as the iridium thin film atomic layer deposition method of reducing precursor, comprising the following steps:

[0030] S1. Use atomic layer deposition equipment to heat 1-ethylcyclopentadienyl-1 liquid iridium source raw material to 120°C, and evacuate to the ultimate pressure, and the ultimate pressure after evacuation is 0.5Pa;

[0031] S2. After the atomic layer deposition system is heated evenly, the heating time is 40 minutes, and then the carrier gas flow rate is turned on to 20 sccm. The uniform heating temperature of the atomic layer deposition system is 200 ° C, and the pressure in the atomic layer deposition system is 30 Pa;

[0032] S3, open the 1-ethylcyclopentadienyl-1 liquid iridium source atomic layer deposition pulse valve, the pulse valve opening time is 1000ms, so that the 1-ethylcyclopentadienyl-1 liquid iridium source is introduced int...

Embodiment 2

[0039] A kind of 3-cyclohexadienyl as liquid iridium source precursor, the iridium thin film atomic layer deposition method as reducing precursor with methylhydrazine reducing agent, comprises the following steps:

[0040] S1. Use atomic layer deposition equipment to heat the 3-cyclohexadiene-based liquid iridium source material to 130°C, and vacuumize to the ultimate pressure. The ultimate pressure after vacuuming is 0.5Pa;

[0041]S2. After the atomic layer deposition system is heated evenly, the heating time is 40 minutes, and then the carrier gas flow rate is turned on at 50 sccm. The uniform heating temperature of the atomic layer deposition system is 300°C, and the pressure in the atomic layer deposition system is 80Pa;

[0042] S3. Open the 3-cyclohexadiene-based liquid iridium source atomic layer deposition pulse valve, and the pulse valve opening time is 2000ms, so that the 3-cyclohexadiene-based liquid iridium source is introduced into the reaction chamber of the equi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
Film thicknessaaaaaaaaaa
Film thicknessaaaaaaaaaa
Login to view more

Abstract

The invention discloses an atomic layer deposition technology and method used for preparing an iridium thin film. The method comprises a liquid iridium source and a hydrazine reduction agent. The liquid iridium source serves as a precursor, the hydrazine reduction agent serves as a reduction precursor, and 1-ethyl cyclopentadienyl-1, 3-cyclohexadienyl (I) and other raw materials can be adopted bythe liquid iridium source. The liquid iridium source Ir is selected as the iridium precursor, the hydrazine reduction agent is selected as the reduction precursor, the heat type atomic layer deposition technology can be directly utilized, and the simple substance iridium thin film can be deposited and is superior to plasma NH3, hydrogen and other gas used in the prior art; and in the use process,operation is more convenient, safer and easier, inconvenience of operation of plasma hydrogen, plasma ammonia gas and the like can be avoided, the preparation process of the simple substance iridium thin film can be simplified, and cost can be saved.

Description

technical field [0001] The invention relates to the technical field related to the preparation method of iridium thin film, in particular to an atomic layer deposition technology and method for preparing iridium thin film. Background technique [0002] The noble metal iridium Ir has strong oxidation resistance, high conductivity, strong catalytic activity and good corrosion resistance. These properties make iridium thin films widely used in electrode materials, microelectronics, optical devices and high temperature oxidation resistance. Coatings, it is worth noting that these metals are very rare in the earth's crust, which combined with their excellent properties and wide range of applications make them expensive. Currently, methods for preparing Ir thin films generally include physical vapor deposition, electrochemical deposition, sol-gel, halide chemical vapor deposition, and metal-organic chemical vapor deposition. The most commonly used ones are physical vapor depositi...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): C23C16/18C23C16/455C23C16/448
CPCC23C16/18C23C16/45525C23C16/4481
Inventor 不公告发明人
Owner 江苏迈纳德微纳技术有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products