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Defect detection and recognition method and device, computer readable medium and electronic equipment

A defect detection and identification method technology, applied in computing, image data processing, instruments, etc., can solve problems such as low efficiency and high cost, and achieve the effect of improving accuracy and quality inspection efficiency

Active Publication Date: 2020-06-30
TENCENT TECH (SHENZHEN) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, at present, the accuracy of quality inspection results is mainly guaranteed through manual quality inspection, which is costly and inefficient

Method used

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  • Defect detection and recognition method and device, computer readable medium and electronic equipment
  • Defect detection and recognition method and device, computer readable medium and electronic equipment
  • Defect detection and recognition method and device, computer readable medium and electronic equipment

Examples

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Embodiment Construction

[0039] Example embodiments will now be described more fully with reference to the accompanying drawings. Example embodiments may, however, be embodied in many forms and should not be construed as limited to the examples set forth herein; rather, these embodiments are provided so that this application will be thorough and complete, and will fully convey the concepts of example embodiments to those skilled in the art.

[0040] Furthermore, the described features, structures, or characteristics may be combined in any suitable manner in one or more embodiments. In the following description, numerous specific details are provided in order to give a thorough understanding of the embodiments of the application. However, those skilled in the art will appreciate that the technical solutions of the present application may be practiced without one or more of the specific details, or other methods, components, devices, steps, etc. may be employed. In other instances, well-known methods,...

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Abstract

The embodiment of the invention provides a defect detection and recognition method and device, a computer readable medium and electronic equipment. The defect detection and identification method comprises the following steps: acquiring a target product image; matching the target product image with a template image corresponding to the target product image to obtain a first defect image of the target product image; performing defect detection processing on the target product image through a neural network model to obtain a second defect graph corresponding to the target product image; and identifying defects contained in the target product image by combining the first defect image and the second defect image. According to the technical scheme, the accuracy of the quality inspection result can be improved, manual quality inspection can be replaced, and the quality inspection efficiency is effectively improved.

Description

technical field [0001] The present application relates to the field of computer and communication technologies, and in particular, to a defect detection and recognition method, device, computer-readable medium, and electronic equipment. Background technique [0002] Defect detection and identification are widely used in industrial manufacturing and quality monitoring, such as liquid crystal panel defect identification, workpiece surface quality inspection, cloth surface defect identification, aerospace equipment quality inspection, etc. Through defect detection, defects on the surface of the product can be found, which can be corrected by maintenance personnel in time to ensure product quality. In order to accurately determine whether the product quality is qualified, which process to choose for maintenance, etc., it is usually necessary to obtain the target product that is suspected of including product defects. After the image is captured, the target product image is caref...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06T7/00G06T7/187
CPCG06T7/0006G06T7/187G06T2207/10004G06T2207/30164Y02P90/30
Inventor 石康
Owner TENCENT TECH (SHENZHEN) CO LTD
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