A non-volatile memory verification system and method

Abstract

An embodiment of the present invention provides a system and method for verifying a non-volatile memory. The system includes: a processor configured to: receive verification information when verifying the non-volatile memory to be verified; classify the verification information into verification instructions and Verification data; the FPGA is used to: determine a verification logic circuit according to the verification instruction and the verification data; and verify the non-volatile memory to be verified through the verification logic circuit. In the embodiment of the present invention, through the two simple and efficient control levels of the processor and the FPGA, the adaptive verification logic circuit can be determined in real time according to the specific verification information of the non-volatile memory to be verified, which is very suitable for the design verification of the non-volatile memory chip The changeable verification requirements of the stage have greater convenience and flexibility.

Description

technical field [0001] The invention relates to the technical field of memory processing, in particular to a non-volatile memory verification system and method. Background technique [0002] With the development of various electronic devices and embedded systems, non-volatile memory devices are widely used in electronic products. During the design and production process of the non-volatile memory, it is usually necessary to carry out test verification to determine whether the design of the non-volatile memory is reasonable or whether the factory-made non-volatile memory can be used normally. [0003] In the prior art, the non-volatile memory is usually tested and verified by semiconductor automatic test equipment. The semiconductor automatic test equipment is mainly used for batch testing in the mass production stage of non-volatile memory chips. The purchase cost is high, and it is difficult to obtain a lower The cost to fully cover the requirements of the chip in the desi...

AI Technical Summary

Problems solved by technology

[0003] In the prior art, the non-volatile memory is usually tested and verified by semiconductor automatic test equipment. The semiconductor automatic test equipment is mainly used for batch testing in the mass production stage of non-volatile memory chips. The purchase cost is high, and it is difficult to obtain a lower The cost to fully cover the requirements of the chip in the design verification phase

Moreover, this complex automatic test equipment requires long-term learning and training. It is difficult for designers in the verification stage to quickly master it. Users cannot design and change the logic circuit of the internal hardware board of the device by themselves, which affects the automatic test equipment in the chip design verification stage. Convenience and flexibility of use

Images