Mutual inductor handover test switching device and switching method thereof

Abstract

The invention discloses a mutual inductor handover test switching device and a switching method thereof. The device comprises four sets of switching circuits, respectively a first group of secondary winding switching loop, a second group of secondary winding switching loop, a third group of secondary winding switching loop and a fourth group of secondary winding switching loop, each of the switching circuits comprises an I+ input end, an I-input end, a U+ input end, a U- input end, a first selector switch, a second selector switch, an output end E, an output end L and an output end D. The I+ input end and the U+ input end are connected to one end of a secondary winding of the transformer in parallel, the I- input end and the U- input end are connected to the other end of the secondary winding of the transformer in parallel, the I+ input end is connected to the output end D and the I- input end through a first selector switch, and the I- input end is connected to the output end E and the output end L through a second selector switch. According to the invention, the mutual inductor with no more than four groups of secondary windings can be tested, the switching loop is simple, the switching is convenient, the test during mutual inductor handover is rapidly realized, the test time is shortened, and the test efficiency is improved.

Description

technical field [0001] The invention relates to a switching device for a transformer handover test and a switching method thereof, and belongs to the technical field of transformer handover test equipment. Background technique [0002] At present, when we are testing the transformer, the test items are as follows: [0003] insulation test Characteristic test 1. Primary to secondary insulation resistance 4. Ratio 2. Primary to secondary AC withstand voltage 5. Excitation characteristics, polarity calibration, secondary winding direct resistance 3. Insulation resistance to ground between secondary windings [0004] During the test, there were two problems: [0005] First aspect: For the above test items, the position of the test line that needs to be connected to the secondary terminal is different, and the state of the short circuit of the outgoing terminal of the secondary winding is also different. It is necessary for the tester to frequ...

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Problems solved by technology

[0005] First aspect: For the above test items, the position of the test line that needs to be connected to the secondary terminal is different, and the state of the short circuit of the outgoing terminal of the secondary winding is also different. It is necessary for the tester to frequently change the test line connected to the secondary terminal. The position and the short-circuit state of the secondary terminals are used to meet the requirements of various tests, which is time-consuming and labor-intensive

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