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A method and medium for image correction of a line-scanning CCD camera based on a rotating stage

A technology of image correction and line scanning, applied in image analysis, graphic image conversion, image data processing, etc., can solve the problems affecting the improvement of factory efficiency, increase of weak defects, loss, etc., and achieve the effect of improving efficiency and shortening production time

Active Publication Date: 2020-10-02
WUHAN JINGLI ELECTRONICS TECH +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] like figure 1 As shown, the existing inspection process of the rotating stage is generally that the object to be inspected is carried on the rotating stage and rotated to the inspection station, and the area array camera is notified to take the image. improve
In addition, with the development trend of some electronic products, such as display screens / panels, towards large screens and thinner panels, the probability of weak defects is greatly increased. inspection and cause economic loss to the manufacturer

Method used

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  • A method and medium for image correction of a line-scanning CCD camera based on a rotating stage
  • A method and medium for image correction of a line-scanning CCD camera based on a rotating stage
  • A method and medium for image correction of a line-scanning CCD camera based on a rotating stage

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Embodiment approach

[0044] According to one embodiment of the present invention, a method for correcting images of a line-scan CCD camera based on a rotating stage is provided, including:

[0045] S1: The rotating stage drives the detection object to rotate. The line-scan CCD camera is located above the rotating stage and the extension line of its imaging line passes through the center of the rotating stage. A detection image of the detection object;

[0046] Further, the scanning area of ​​the line-scan CCD camera is an annular area;

[0047] S2: Establish a first coordinate system with the detection image, and obtain the first coordinate value and gray value of each pixel of the detection object in the first coordinate system;

[0048] S3: Establish a second coordinate system with a circular area, and obtain the second coordinate value of each pixel of the detection object in the second coordinate system; S4: Combine the first coordinate value in the first coordinate system with the first coor...

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Abstract

The invention provides an image correction method and medium for a line-scan CCD camera based on a rotating stage, which includes a rotating stage that drives a detection object to rotate, the line-scanning CCD camera is located above the rotating stage, and the extension line of its imaging line passes through the center of the rotating stage. A line-scan CCD camera collects images of the detection object to generate a detection image of the detection object; establishes a first coordinate system with the detection image, and obtains the first coordinate value and gray value of each pixel of the detection object in the first coordinate system; Establish a second coordinate system in the ring-shaped area, obtain the second coordinate value of each pixel point of the detection object in the second coordinate system; match the first coordinate value in the first coordinate system with the second coordinate value in the second coordinate system , to establish a coordinate mapping relationship; according to the coordinate mapping relationship, the acquired detection image is converted into an original spatial image on the rotating stage. Through the correction method of the present invention, the limitation of the traditional area array camera can be successfully avoided, and the benefit is greatly improved at the same time.

Description

technical field [0001] The technology mainly relates to the field of image data processing of automatic detection, in particular to an image correction method of a line-scan CCD camera based on a rotating stage. Background technique [0002] In the production and testing process of existing products, due to the influence of various factors such as environment, equipment and people, that is, cutting, cleaning, laminating, coating, transportation and other links may cause damage to the product. Compared with manual inspection, AOI defect detection has been gradually deployed in each station of panel production due to its fast detection speed and no influence of subjective factors, and has become an important link in factory quality management. [0003] In some specific areas of the factory, due to the constraints of the site area, the line body of the inspection station cannot be arranged in a straight line, so it needs to be designed as a rotating stage inspection mode. At p...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06T7/80G06T3/40
CPCG06T3/4038G06T7/80G06T2200/32
Inventor 梁晓捷
Owner WUHAN JINGLI ELECTRONICS TECH
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