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Substrate defect detection method and device

A detection method and substrate technology, which are applied in measurement devices, optical testing flaws/defects, optics, etc., can solve problems such as waste of production capacity, and achieve the effect of saving and repairing production capacity

Active Publication Date: 2020-08-11
SHENZHEN CHINA STAR OPTOELECTRONICS TECH CO LTD
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  • Summary
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  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] Embodiments of the present invention provide a method and device for detecting substrate defects, aiming to solve the problem of waste of production capacity due to repeated repair of process defects in the substrate manufacturing process

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  • Substrate defect detection method and device
  • Substrate defect detection method and device

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Embodiment Construction

[0052] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative efforts fall within the protection scope of the present invention.

[0053] In describing the present invention, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", " The orientation or positional relationship indicated by "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation shown in the drawings Or positional relationship is only for the convenience of describing the present invention and simpl...

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Abstract

The embodiment of the invention discloses a substrate defect detection method and device, and the method comprises the steps: recognizing a defect of a substrate in a first substrate process after thefirst substrate process, and generating a first process defect file which comprises an information field of the first substrate process and first parameter information of the first substrate process;acquiring preset first standard parameter information of the first substrate process; comparing the first parameter information with the first standard parameter information, and determining whetherthe substrate after the first substrate process needs to be repaired or not; if yes, sending a first repairing instruction to the substrate repairing equipment, thus the defects of the first substrateprocess in the substrate are repaired by the substrate repair equipment according to the first process defect file, the information column for distinguishing the substrate process is added into the software of the substrate defect detection device, unnecessary repeated repair of the process meeting the condition is avoided, and the repair capacity is saved.

Description

technical field [0001] The invention relates to the technical field of display panel production, in particular to a method and device for detecting substrate defects. Background technique [0002] Liquid crystal display panels have been rapidly developed and widely used in recent years. Most of the liquid crystal display devices currently on the market are backlight liquid crystal display devices, which include a liquid crystal display panel and a backlight module. Usually, the liquid crystal display panel consists of a color filter substrate (CF, Color Filter), a thin film transistor substrate (TFT, Thin Film Transistor), a liquid crystal (LC, Liquid Crystal) sandwiched between the color filter substrate and the thin film transistor substrate, and a sealant (Sealant) ) composition; its working principle is to control the rotation of the liquid crystal molecules in the liquid crystal layer by applying a driving voltage on the two glass substrates, and refract the light from...

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Application Information

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IPC IPC(8): G02F1/13G01N21/95
CPCG02F1/1309G01N21/95G01N2021/9513
Inventor 叶巧云
Owner SHENZHEN CHINA STAR OPTOELECTRONICS TECH CO LTD
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