Optical module debugging method, device, electronic equipment and storage medium

Abstract

The application relates to an optical module debugging method, device, electronic equipment and storage medium, and belongs to the technical field of optical communication. Obtain the slope and intercept of the characteristic relationship curve corresponding to the laser current and luminous power of the optical module, and obtain the coupling mode between the drive circuit and the laser in the optical module; according to the slope, intercept, and the preset formula corresponding to the coupling mode, calculate Adjust the bias current and modulation current corresponding to the target average optical power and target extinction ratio; test whether the average optical power under the bias current and modulation current is within the allowable error range of the target average optical power; if yes, test Whether the extinction ratio under the bias current and the modulation current is within the allowable error range of the target extinction ratio; if yes, determine the bias current and the modulation current as required parameters. This method only needs a few steps to obtain the final debugging parameters with high probability, avoids repeated cycle debugging, and greatly improves the debugging efficiency.

Description

technical field [0001] The application belongs to the technical field of optical communication, and in particular relates to an optical module debugging method, device, electronic equipment and storage medium. Background technique [0002] Average optical power (Average optical power, AOP) and extinction ratio (Extinction Ratio, ER) are the two most critical indicators of optical modules. Due to the different luminous efficiencies of lasers, these two indicators need to be individually debugged during the production of each optical module. The debugging methods of these two indicators have a great impact on the production efficiency of optical modules. Therefore, advanced and efficient debugging methods can greatly improve the production efficiency and capacity of optical modules. [0003] For directly modulated laser optical modules, AOP and ER are affected by the bias current (IBIAS) and modulation current (IMOD) provided by the laser drive circuit. The debugging process...

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Problems solved by technology

[0005] In view of this, the purpose of this application is to provide a method, device, electronic equipment and storage medium for optical module debugging, so as to improve the problem that the existing test method needs to cycle many times to find the final suitable value, making the problem of low efficiency

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