Device and method for anodized oxidation of an anode element for a curved x-ray grating, system for producing a curved x-ray grating and curved x-ray grating

Abstract

The present invention relates to a device for anodized oxidation of an anode element for a curved X-ray grating, the device (10) comprising: an anode element (12); a cathode element (14); an electrolytic medium (16); a conductor element (18); and a carrier element (20); wherein the anode element (12) comprises a first side (11) and a second side (13), wherein the second side (13) faces opposite tothe first side (11); wherein the carrier element (20) comprises a curved surface section (21) that extends along a curvature around a center of curvature (30); wherein the carrier element (20) is configured to receive the second side (13) of the anode element (12) for attaching the conductor element (18) to the first side (11) of the anode element (12); wherein the curved surface section (21) isconfigured to receive the conductor element (18) after detaching the second side (13) of the anode element (12) from the carrier element (20); wherein the electrolytic medium (16) is configured to connect the anode element (12) and the cathode element (14); wherein the cathode element (14) in conjunction with the anode element (12) and the electrolyte medium (16) is configured to generate at leastone group of electric field lines (26) that define a plane (31, 33, 35, 37, 39), wherein at least a straight extrapolation (32) of the group of electric field lines intersect the center of curvature,wherein the generation of the at least one group of electric field lines (26) results in an anodized oxidation of the anode element (12) on the curved surface section (21). The invention provides a device (10) that avoids the risk of damaging the grating structures and getting a low yield.

Description

technical field [0001] The invention relates to a device and a method for anodizing anodic elements for curved X-ray gratings, a system for producing curved X-ray gratings and curved X-ray gratings. Background technique [0002] In the case of trench or wall structures with a width of a few μm and a depth of approximately 200-300 μm, special grating components are required for dark-field x-ray imaging or phase-contrast imaging. The grooves are filled with an X-ray absorbing material, while the walls are transparent or low absorbing for X-ray radiation. In dark field X-ray imaging systems, so-called G2 gratings are mounted in front of the detector with a distance between source and image of more than 2 m. The G2 grating is used to analyze the wavefront of the x-ray radiation traveling from the source of x-ray radiation through the further grating and the object. This requires focusing of the grating surface of the G2 grating in the direction of the position of the X-ray rad...

AI Technical Summary

Problems solved by technology

Bending of the X-ray grating may risk damage to the grating structure and result in low yields due to the brittleness of the base material of the wall structure of the X-ray grating in combination with the filling material of the trenches

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