A kind of glue coating method of ultra-thin wafer with taiko ring structure as substrate
An ultra-thin, wafer-based technology, applied in coatings, devices for coating liquid on the surface, electrical components, etc., can solve problems such as difficult removal, liquid backsplash, photoresist accumulation, etc., to avoid photoresist The effect of accumulation, avoiding liquid splashing and improving uniformity
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Embodiment 1
[0055] Coating photoresist on a wafer with a thinned part of 50 μm and a diameter of 200 nm, the viscosity of the photoresist is 34cp (centipoise), including the following steps:
[0056] S1a: vacuum suction the wafer onto the wafer stage, control the preset vacuum degree of the wafer stage to 40KPa, and the exhaust air volume in the gluing chamber to be 30m / s. The wafer stage operates at a first high speed of 1000r / s. Rotate for 10s, while the glue nozzle glues the center of the wafer;
[0057] S2a: After the gluing is completed, the wafer stage is rotated at a first low speed of 100r / s for 5s to reflow the gluing;
[0058] S3a: the film carrier rotates at the second low speed of 100r / s for 10s, and then rotates at the second high speed of 1500r / s for 5s to perform variable-speed glue rejection;
[0059] S4a: the wafer stage is rotated at the third low speed of 100r / s for 5s to complete the photoresist ejection;
[0060] S5a: the wafer stage is rotated at a third high speed...
Embodiment 2
[0064] Coating photoresist on a wafer with a thinned part of 80 μm and a diameter of 200 nm, the viscosity of the photoresist is 34cp (centipoise), including the following steps:
[0065] S1b: The wafer is vacuum-adsorbed on the wafer stage, the preset vacuum degree of the wafer stage is controlled to 20KPa, the exhaust air volume in the gluing chamber is 40m / s, and the wafer stage is controlled at the first high speed of 800r / s. Rotate for 10s, while the glue nozzle glues the center of the wafer;
[0066] S2b: After the gluing is completed, the wafer stage is rotated at the first low speed of 100r / s for 5s to reflow the gluing;
[0067] S3b: the film carrier rotates at the second low speed of 100r / s for 10s, and then rotates at the second high speed of 1600r / s for 5s to perform variable-speed glue rejection;
[0068] S4b: The wafer stage is rotated at a third low speed of 100r / s for 5s to complete the photoresist spin;
[0069] S5b: the wafer stage is rotated at a third hig...
Embodiment 3
[0073] Apply photoresist to a wafer with a thickness of 100 μm and a diameter of 200 nm at the thinned part. The viscosity of the photoresist is 34 cP (centipoise), including the following steps:
[0074] S1c: The wafer is vacuum-adsorbed on the wafer stage, the preset vacuum degree of the wafer stage is controlled to be 10KPa, the exhaust air volume in the gluing chamber is 40m / s, and the wafer stage is controlled at the first high speed of 700r / s. Rotate for 10s, while the glue nozzle glues the center of the wafer;
[0075] S2c: After the gluing is completed, the wafer stage is rotated at the first low speed of 100r / s for 5s to reflow the gluing;
[0076] S3c: the film carrier rotates at the second low speed of 100r / s for 10s, and then rotates at the second high speed of 1700r / s for 5s to perform variable-speed gluing;
[0077] S4c: the wafer stage is rotated at a third low speed of 100r / s for 5s to complete the photoresist spin;
[0078] S5c: the wafer stage rotates at a ...
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