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Semiconductor device, memory device, and switch device

A memory and semiconductor technology, applied in the direction of semiconductor devices, electric solid state devices, electrical components, etc., can solve the problem of obvious oxidation of bidirectional critical value switches

Inactive Publication Date: 2020-09-22
MACRONIX INT CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, even with such techniques, oxidation of bidirectional threshold switches can still be a significant problem

Method used

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  • Semiconductor device, memory device, and switch device
  • Semiconductor device, memory device, and switch device
  • Semiconductor device, memory device, and switch device

Examples

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Embodiment Construction

[0057] refer to Figure 1 to Figure 6 A detailed description of embodiments of the invention is provided.

[0058] figure 1 is a simplified diagram of a switching device comprising a barrier layer 15 as described herein and a switching layer 10 with a bidirectional threshold switching material. The barrier layer 15 is a composition comprising silicon and carbon on the top surface of the switching layer 10 of bidirectional threshold switching material. The switch device includes a first electrode 11 and a second electrode 12 , wherein the switch layer 10 is connected in series between the first electrode 11 and the second electrode 12 . The barrier layer 15 contacts the surface of the switch layer 10 of the bidirectional threshold switch material, thereby preventing or reducing oxidation of the material during fabrication. A voltage V1 may be applied to the first electrode 11 , and a voltage V2 may be applied to the second electrode 12 . In some embodiments, the second barr...

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Abstract

The invention provides a semiconductor device, a memory device, and a switch device. The switch device has a first electrode, a second electrode, and a switching layer between the first and second electrodes. An in situ barrier layer is disposed between the first and second electrodes. The barrier layer comprises a composition including silicon and carbon. The switch device can be used in memory devices.

Description

technical field [0001] The present invention relates to switching devices for use in integrated circuits, including integrated circuit memory devices. Background technique [0002] There are many applications of switching devices such as transistors and diodes in integrated circuits. One type of switching device, known as a bidirectional threshold switch based on bidirectional materials, is characterized by a large resistance drop at the switch threshold voltage and a return to a high resistance blocking state when the voltage drops below the hold threshold . [0003] For example, switching devices have been used in various programmable resistive memory devices including high density array cells organized in a cross-point architecture. For example, some cross-point architectures utilize memory cells that include a phase-change memory element in series with a bidirectional threshold switch (OTS). Other architectures have also been used, including various 2D and 3D array st...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L45/00
CPCH10N70/881H10N70/231H10B63/24H10B63/80H10N70/20H10N70/882H10N70/026H10N70/8828H10N70/826H10N70/021
Inventor 郑怀瑜郭奕廷龙翔澜罗伯特·布鲁斯发比又·卡塔
Owner MACRONIX INT CO LTD