Automatic lifting device for testing minority carrier lifetime of end face of polycrystalline, single crystal or cast single crystal small square ingot

Abstract

The invention discloses an automatic lifting device for testing minority carrier lifetime of an end face of a polycrystalline, single crystal or cast single crystal small square ingot. The method is characterized in that the device comprises a bottom plate, a guide column, a guide sleeve, a top plate, a check ring, an infrared height tester and a vertical transmission device; the bottom plate canbe fixed on a pedestal of a conventional minority carrier lifetime tester through bolts; the minority carrier lifetime tester can also be directly placed on the minority carrier lifetime tester base;the four guide columns are fixed on the bottom plate; the four guide sleeves are fixed on the top plate; the upper surface of the top plate is used for placing polycrystalline, monocrystalline or castmonocrystalline small square ingots with minority carrier lifetime to be measured; the check ring is used for fixing polycrystal, single crystal or cast single crystal small square ingots and preventing the polycrystal, single crystal or cast single crystal small square ingots from sliding, the infrared height tester is composed of a guide column, a guide sleeve and an infrared emitting device; the infrared height is consistent with the height of a minority carrier lifetime tester probe, and the vertical transmission device can be in a hydraulic transmission mode, a pneumatic transmission mode, a screw transmission mode and the like.

Description

technical field [0001] The invention relates to the field of photovoltaic ingot casting, and specifically refers to an automatic lifting device for testing the minority carrier life of the end face of a polycrystalline, single crystal or cast single crystal small square ingot. Background technique [0002] In order to ensure the stability of the quality of polycrystalline silicon ingots, single crystal or cast single crystal ingots, the production line often conducts minority carrier lifetime tests on the truncated sections of polycrystalline, single crystal or cast single crystal small square ingots, and the small square ingots The height is not fixed, and the height of the probe needs to be manually adjusted every time the minority carrier life is tested. The adjustment range of the probe is within 5mm, which causes some small square ingots to be unable to be tested, and the manual adjustment work efficiency is very low. As for the lifting device, the present invention spe...

AI Technical Summary

Problems solved by technology

[0002] In order to ensure the stability of the quality of polycrystalline silicon ingots, single crystal or cast single crystal ingots, the production line often conducts minority carrier lifetime tests on the truncated sections of polycrystalline, single crystal or cast single crystal small square ingots, and the small square ingots The height is not fixed, and the height of the probe needs to be manually adjusted every time the minority carrier life is tested. The adjustment range of the probe is within 5mm, which causes some small square ingots to be unable to be tested, and the manual adjustment work efficiency is very low. Lifting device, the present invention specially designed an automatic lifting device for testing polycrystalline, single crystal or casting single crystal small square ingot end face minority carrier life

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