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Open measurement environment spectral measurement method based on imaging condition correction

A technology of imaging conditions and spectral measurement, applied in spectrometry/spectrophotometry/monochromator, measuring device, optical radiation measurement, etc., can solve problems such as no reasonable and effective solutions

Active Publication Date: 2020-10-09
WUHAN TEXTILE UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] For the above problems, there are no reasonable and effective solutions in academia and industry.

Method used

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  • Open measurement environment spectral measurement method based on imaging condition correction
  • Open measurement environment spectral measurement method based on imaging condition correction
  • Open measurement environment spectral measurement method based on imaging condition correction

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Embodiment Construction

[0055] When the technical solution of the present invention is specifically implemented, it can be run by those skilled in the art using computer software technology. In conjunction with the accompanying drawings, the specific description of the embodiments of the present invention is provided as follows.

[0056] Such as figure 1 As shown, the embodiment provides an open measurement environment spectral measurement method based on imaging condition correction, which can solve the problem of inconsistency between the open measurement environment and the reference measurement environment imaging conditions, and further correct the spectral measurement error caused by the difference in light source , effectively improving the accuracy of spectral measurement, ensuring that the measurement system is oriented to the practical application of spectral measurement in any open environment, and can be applied to spectral data measurement in many fields such as industrial inspection, cu...

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Abstract

The invention discloses an open measurement environment spectral measurement method based on imaging condition correction. The method comprises the following steps: measuring to obtain light source data of a reference measurement environment; in a reference measurement environment, shooting digital images of a training sample set and a reference whiteboard, and extracting respective raw response values of the digital images; calculating a spectrum estimation matrix Q; in an open measurement environment, shooting digital images of a measurement object and a reference whiteboard, and extractingraw response values of the digital images; calculating a correction matrix M1 for preliminary correction of imaging conditions by utilizing the raw response value of the reference whiteboard; estimating k target light source data corresponding to the open measurement environment; calculating a correction matrix M2 for further correction of imaging conditions; correcting the raw response value of the measurement object by using the correction matrixes M1 and M2; estimating the spectrum of the measurement object by using the spectrum estimation matrix Q; completing spectral measurement, and finally obtaining spectral data of the measurement object.

Description

technical field [0001] The invention belongs to the technical field of computer digital image processing, and in particular relates to an open measurement environment spectrum measurement method based on imaging condition correction. Background technique [0002] The spectrum of an object represents the ratio of the outgoing light radiation on the surface of the object to the incident light radiation in each band, reflecting the absorption and reflection characteristics of the object itself for radiant energy, and is one of the main characteristics that characterize the physical and chemical properties of the object itself. In the visible light range, the spectrum is the fingerprint of color information. Spectrum plays an important role in color reproduction, color control, and color detection in many industrial production fields, as well as in spectral analysis such as image analysis, feature extraction, and material detection in other related application fields. Therefore,...

Claims

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Application Information

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IPC IPC(8): G01J3/28
CPCG01J3/2823G01J2003/284G01J2003/2866
Inventor 梁金星胡新荣何儒汉熊明福陈常念吴晓堃何凯刘军平彭涛
Owner WUHAN TEXTILE UNIV