Instruction-EPI-based fine-grained GPDSP power consumption test method and system, and medium

Abstract

The invention discloses an instruction-EPI-based fine-grained GPDSP power consumption test method and system, and a medium. The instruction-EPI-based fine-grained GPDSP power consumption test method comprises the steps: analyzing an instruction stream of a target program, and obtaining various instructions of the target program and occurrence times Ni of the instructions; calculating the active power consumption Eactive of the target program according to the various instructions of the target program and the appearing times Ni of the instructions in combination with the EPI of the various instructions on the target GPDSP platform; obtaining static power consumption Estatic and no-load power consumption Eidle of the target program; and adding the static power consumption Estatic, the no-load power consumption Eid and the active power consumption Eactive to obtain the total power consumption E of the target program on the target GPDSP platform. According to the invention, the measurementvalue is stable, the accuracy is good, the reliability is high, and the power consumption test has high universality and expansibility.

Description

technical field [0001] The invention relates to the field of processor power consumption testing, in particular to a fine-grained GPDSP power consumption testing method, system and medium based on an instruction EPI. Background technique [0002] With the wide application and development of processor-centric products and services, from large data centers to small mobile devices, it is necessary to test and evaluate their power consumption, so as to perform resource allocation and scheduling and program algorithm optimization to achieve Balance of performance and power consumption. At the same time, in the process of chip design and manufacturing, through the power consumption test of products with different architectures and different processes, so as to comprehensively compare product performance. [0003] The development of GPDSP (General Purpose DSP) technology has greatly improved its storage capacity and computing speed. It is not only widely used in the fields of comm...

AI Technical Summary

Problems solved by technology

However, in the actual measurement process of the traditional functional component measurement scheme, when the same functional unit executes different instructions, the actual circuit logic it executes is different, and the instantaneous power is not a stable value and has large fluctuations, which leads to the failure of the entire program. The power consumption test is not very accurate and reliable

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