PCB test method and device

A technology of a test device and a test method, which is applied in the direction of measurement device, electronic circuit test, printed circuit test, etc., can solve the problems of large test frame, large production cost, easy omission or error, etc.

Pending Publication Date: 2020-10-23
KINWONG ELECTRONICS TECH LONGCHUAN
View PDF3 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The traditional PCB test method must use a test frame for testing. The production of the test frame requires a production cycle and requires a lot of production costs. In addition, due to the relatively large size of the test frame (one model requires 1 to 2 test

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • PCB test method and device
  • PCB test method and device
  • PCB test method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0047] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention, and similar component numbers in the drawings represent similar components. Apparently, the embodiments described below are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0048] It should be understood that when used in this specification and the appended claims, the terms "comprising" and "comprises" indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude one or Presence or addition of multiple other features, integers, steps, operations, elements, components and / or col...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention discloses a PCB test method and device, and relates to the technical field of metal-based printed circuit board manufacturing. The PCB test method is applied to equipment in which n flying probe test machines are connected in series, a test network is divided through a test host, a total test network is divided into m*n test subareas, the number of the test subareas corresponds to the number of total test axes, and each test axis is responsible for one test subarea; and when testing is carried out, along with advancing of a PCB, the testing axes of the flying probe test machinescorrespondingly carry out detection in different testing subareas, and when all the flying probe testing machines are passed, all the testing subareas are also tested so that testing of the PCB to betested is completed, and a whole test method is efficient and capable of carrying out continuous and automatic testing.

Description

technical field [0001] The invention relates to the technical field of manufacturing metal-based printed circuit boards, in particular to a PCB testing method and device. Background technique [0002] With the development of the electronics industry, customers are increasingly pursuing the heat dissipation of PCB products. Metal-based thick copper plates are more and more used in high-power lighting and power supply products due to their high-efficiency heat dissipation performance. As an electronic product, the detection of its electrical performance is essential. The traditional method is to open a test stand for high voltage and on-off testing. This test method is suitable for batch testing, but it needs to make a large number of test stands, which is costly and requires a lot of space. Storage of test racks requires innovative design of a method that does not require test racks and meets continuous automatic testing. [0003] The traditional PCB test method must use a t...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01R31/01G01R31/28
CPCG01R31/01G01R31/2806G01R31/2808
Inventor 邹子誉
Owner KINWONG ELECTRONICS TECH LONGCHUAN
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap