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Missing data-based sample analysis method and device, electronic equipment and medium

A missing data, sample analysis technology, applied in the field of big data, can solve problems such as inaccurate sample analysis

Pending Publication Date: 2020-10-27
PING AN TECH (SHENZHEN) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The present invention provides a sample analysis method, device, electronic equipment and computer-readable storage medium based on missing data, the main purpose of which is to solve the inaccurate phenomenon of sample analysis caused by missing data

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  • Missing data-based sample analysis method and device, electronic equipment and medium
  • Missing data-based sample analysis method and device, electronic equipment and medium
  • Missing data-based sample analysis method and device, electronic equipment and medium

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Embodiment Construction

[0051] It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention.

[0052] The execution subject of the sample analysis method based on missing data provided in the embodiment of the present application includes but is not limited to at least one of the electronic devices that can be configured to execute the method provided in the embodiment of the present application, such as a server and a terminal. In other words, the sample analysis method based on missing data can be executed by software or hardware installed on a terminal device or a server device, and the software can be a blockchain platform. The server includes but is not limited to: a single server, a server cluster, a cloud server or a cloud server cluster, etc.

[0053] Reference figure 1 The flow chart of a sample analysis method based on missing data provided by an embodiment of the present invention is shown. In an em...

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Abstract

The invention relates to a big data technology, and discloses a missing data-based sample analysis method, which comprises the following steps: obtaining a missing data set and a corresponding label value, calculating the saturation of missing data dimensions in the missing data set, selecting the missing data dimensions of which the saturation is greater than a preset saturation, and generating afeature dimension list; calculating correlation coefficients of missing data dimensions and label values in the feature dimension list, selecting missing data dimensions of which the correlation coefficients are greater than a preset correlation coefficient, and modeling the selected missing data dimensions to generate a missing data insensitive model; and performing data analysis on the to-be-analyzed sample data set by utilizing the missing data insensitive model to obtain an analysis result. The invention further provides a missing data-based sample analysis device, electronic equipment and a storage medium. In addition, the invention also relates to a blockchain technology, and the selected missing data dimension can be stored in the blockchain. According to the invention, the phenomenon of inaccurate sample analysis caused by missing data can be solved.

Description

Technical field [0001] The present invention relates to big data technology, in particular to a sample analysis method, device, electronic equipment and computer readable storage medium based on missing data. Background technique [0002] One difficulty of current real-world data mining is the lack of data. For example, for data based on online or paper questionnaires, respondents often skip specific questions, resulting in incomplete answers to the returned questionnaire. At this time, there will be missing features in this survey sample. [0003] At present, whether it is to fill in missing features or directly discard this missing sample, it has its own shortcomings: among them, for missing feature filling, there is no guarantee that the filled value can truly reflect the missing value; for missing sample, it is discarded In other words, discarding missing samples will result in a waste of information. [0004] Therefore, whether it is filling in missing features or directly dis...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F16/2458G06K9/62G06N20/00
CPCG06F16/2465G06N20/00G06F18/214
Inventor 阮晓雯邓攀徐亮肖京
Owner PING AN TECH (SHENZHEN) CO LTD