On-chip memory online fault diagnosis system and method

Abstract

The invention discloses an online fault diagnosis system for an on-chip memory. The system comprises a storage access controller, a data backup controller, an address parser, an interleaver, a staticmemory tester and an on-chip memory, and is characterized in that the storage access controller converts a received system request into a required address signal, a required write data signal, a required read-write control signal and a required read data signal; the data backup controller is used for backing up the content of the memory packet needing to be backed up to the redundant packet; the address parser distributes an access request of the memory access controller to a memory logic packet. The interleaver maps an access request for a memory logic packet to a memory physical packet; thestatic memory tester is used for periodically testing the on-chip memory; and the on-chip memory is used for storing and reading data. The fault diagnosis coverage rate of the on-chip memory is improved, and the availability and performance of the system are not sacrificed.

Description

technical field [0001] The invention relates to the technical field of integrated circuits, in particular to an on-chip memory online fault diagnosis system and method. Background technique [0002] Under the trend of electrification, intelligence, networking and sharing of automobiles, the electronic and electrical systems of automobiles have ushered in earth-shaking changes. The new system architecture needs higher performance and integrated core controllers (such as SoC and MCU) to support. With the further improvement of the integration of vehicle-mounted SoC and MCU, the capacity of its internal memory is also significantly increased, and at the same time, the probability of failure of the internal memory function of the chip is also increased. Therefore, a new diagnostic structure of on-chip memory is required to realize High-coverage fault diagnosis, while ensuring that the system's runtime performance and functions are not disturbed by the fault diagnosis process. ...

AI Technical Summary

Problems solved by technology

Although the diagnostic coverage has been improved, the availability and performance of the system will be greatly reduced

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