Electronic complete machine accelerated storage test acceleration factor analysis method based on failure big data

Abstract

According to a failure big data-based electronic complete machine accelerated storage test acceleration factor analysis method provided by the invention, the failure big data obtained by different types of electronic complete machines in the storage process is utilized to analyze the acceleration factors of the electronic complete machines more accurately, so that the accuracy of storage period verification is improved. The method specifically comprises the steps of obtaining a part list of an electronic complete machine; querying storage failure information of each part model in the part listaccording to a quality database of the electronic complete machine to form an electronic complete machine failure part list; calculating or looking up a table to obtain the failure rate of each partin the failure part list at the storage temperature Tu and the accelerated storage test temperature TA, and forming a part failure rate table; and analyzing an acceleration factor Af of the accelerated storage test according to the part failure rate table.

Description

technical field [0001] The invention belongs to the technical field of aerospace reliability, and relates to an acceleration factor analysis method for accelerated storage tests of electronic complete machines based on failure big data. Background technique [0002] The storage period of electronic equipment in national defense equipment is very long, and it is necessary to test and verify its storage period through accelerated storage test technology in the test appraisal or later stage of development. In general, the accelerated storage test of electronic products adopts the constant high temperature stress acceleration method, and the key parameter in the design of the constant high temperature stress accelerated test program is the acceleration factor. Usually, when calculating the acceleration factor, the whole machine is often regarded as a series system, and each failure is regarded as an independent process, that is, the failure of any link will cause the failure of ...

AI Technical Summary

Problems solved by technology

[0012] The above formula assumes that the storage failure information of all links in the electronic machine cannot be obtained, or that all links in the electronic machine are newly designed, which is not the actual situation in engineering

Due to the failure to make full use of the failure information in the storage of the existing electronic complete machine, the accuracy of the calculated acceleration factor is not high

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