Method for automatically labeling appearance defect images of industrial products based on semi-supervised learning
A semi-supervised learning and automatic labeling technology is applied in the field of automatic labeling of industrial product appearance defects based on semi-supervised learning. Manual labeling cost, good for large data sets, good robustness
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[0030] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.
[0031] figure 1 According to a preferred embodiment of the present invention, it is a flowchart of a method for automatically labeling industrial product appearance defect images based on semi-supervised learning, such as figure 1 As shown, in order to achieve the above object, the present invention is realized through the following technical solutions, which includes the following steps:
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