Method for automatically labeling appearance defect images of industrial products based on semi-supervised learning
A semi-supervised learning and automatic labeling technology is applied in the field of automatic labeling of industrial product appearance defects based on semi-supervised learning. Manual labeling cost, good for large data sets, good robustness
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.
[0031] figure 1 According to a preferred embodiment of the present invention, it is a flowchart of a method for automatically labeling industrial product appearance defect images based on semi-supervised learning, such as figure 1 As shown, in order to achieve the above object, the present invention is realized through the following technical solutions, which includes the following steps:
[0...
PUM

Abstract
Description
Claims
Application Information

- Generate Ideas
- Intellectual Property
- Life Sciences
- Materials
- Tech Scout
- Unparalleled Data Quality
- Higher Quality Content
- 60% Fewer Hallucinations
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2025 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com