Circuit detection system and circuit detection method

A circuit detection and circuit technology, applied in electronic circuit testing, measuring electricity, measuring devices, etc., can solve the problems of long test time, delay in the production progress of integrated circuits, inability to effectively test the reliability of integrated circuits, etc., and achieve short test time. , improve the accuracy, improve the effect of the detection accuracy

Pending Publication Date: 2020-11-24
TAIWAN SEMICON MFG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, existing testing techniques cannot effectively test the reliability of integrated circuits in every operating state
Furthermore, the existing test technology needs to spend a long time for testing, which undoubtedly seriously delays the production schedule of integrated circuits.

Method used

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  • Circuit detection system and circuit detection method
  • Circuit detection system and circuit detection method
  • Circuit detection system and circuit detection method

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Embodiment Construction

[0018] Embodiments of the present invention will be described below in conjunction with related figures. In the drawings, the same reference numerals represent the same or similar elements or method flows.

[0019] Certain terms are used in the specification and claims to refer to specific elements, but those skilled in the art may use different terms to refer to the same element. The specification and claims do not use the difference in name as a way to distinguish components, but use the difference in function of components as a basis for distinction. The "comprising" mentioned in the description and the claims is an open term and should be interpreted as "including but not limited to". In addition, the term "coupled" herein includes any direct and indirect connection means. Therefore, if it is described that the first element is coupled to the second element, it means that the first element can be directly connected to the second element through electrical connection or s...

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PUM

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Abstract

The embodiment of the invention relates to a circuit detection system and a circuit detection method. The circuit detection method comprises the following steps of: inputting a first test signal to acircuit to be detected when the power supply voltage of the to-be-tested circuit is a first voltage level; when the first test signal is input into the to-be-tested circuit, boosting the power supplyvoltage from the first voltage level to a second voltage level; when the power supply voltage is increased from the first voltage level to a second voltage level, reducing the power supply voltage from the second voltage level to the first voltage level; inputting a second test signal to the to-be-tested circuit when the power supply voltage of the to-be-tested circuit is the first voltage level;when the second test signal is input into the to-be-tested circuit, boosting the power supply voltage from the first voltage level to the second voltage level, wherein the second test signal is a complementary signal of the first test signal.

Description

technical field [0001] Embodiments of the present invention relate to a circuit detection system and a circuit detection method. Background technique [0002] During semiconductor fabrication, wafers must go through a number of fabrication processes to form integrated circuits. In wafer acceptance testing, integrated circuits must pass tests to determine the performance and reliability of the integrated circuits. Reliability testing is often used to detect early life failures in integrated circuit manufacturing. In general, reliability testing uses various techniques such as power looping on / off and applying voltages beyond normal operating conditions to test integrated circuits. However, existing testing techniques cannot effectively test the reliability of integrated circuits in every operating state. Furthermore, the existing testing technology requires a long testing time, which undoubtedly seriously delays the production schedule of integrated circuits. Contents of...

Claims

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Application Information

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IPC IPC(8): G01R31/28
CPCG01R31/2855G01R31/2882
Inventor 吴奇哲洪宗扬郭家铭方奕娜王明义
Owner TAIWAN SEMICON MFG CO LTD
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