Detection device for parameter measurement

Abstract

The invention relates to the technical field of measurement, and discloses a detection device for parameter measurement, which comprises a reference object placing table, a sensor placing plate and abase platform, and is characterized in that the reference object placing table and the sensor placing plate are arranged on the base platform, and a first longitudinal sliding assembly and a transverse sliding assembly are also arranged on the base platform; the sensor mounting plate is arranged on the transverse sliding assembly, a measuring sensor is arranged on the sensor mounting plate, the measuring sensor transversely slides along with the transverse sliding assembly, and the transverse sliding assembly longitudinally slides along with the first longitudinal sliding assembly. The sensormounting plate is also provided with an MSP430 single-chip microcomputer detection unit, and the MSP430 single-chip microcomputer detection unit is provided with a detection algorithm for detecting ameasurement value of the measurement sensor. Compared with the prior art, transverse movement and longitudinal movement of the measurement sensor are achieved through the first longitudinal sliding assembly and the transverse sliding assembly, and the problem that jitter measurement is inaccurate in the measurement process of the sensor is solved; through a detection algorithm, the measurement value of the measurement sensor can be accurately detected.

Description

technical field [0001] The invention relates to the field of measurement technology, in particular to a detection device for parameter measurement. Background technique [0002] As the source of obtaining natural information, sensors are indispensable and important components for industrial production, scientific research and other fields. There are various measurement sensors in the prior art, such as temperature and humidity sensors, infrared sensors, photoelectric sensors, and the like. [0003] For the existing various measurement sensors, environmental factors have a great influence on the measurement during the measurement process, such as ambient pressure, ambient temperature, etc. Measure the actual parameter value of the reference object. When using the measurement sensor to measure, how to avoid the influence of environmental factors on the measurement sensor, so that the measured parameter value is an accurate parameter value of the reference object. The traditio...

AI Technical Summary

Problems solved by technology

[0003] For the existing various measurement sensors, environmental factors have a great influence on the measurement during the measurement process, such as ambient pressure, ambient temperature, etc. Measure the actual parameter value of the reference object. When using the measurement sensor to measure, how to avoid the influence of environmental factors on the measurement sensor, so that the measured parameter value is an accurate parameter value of the reference object. The traditional measurement sensor measurement does not change according to the parameter Due to the characteristics of nonlinearity, large hysteresis, and complex changes in the measured value of the measuring sensor, it is impossible to monitor and predict the accuracy of the parameter values ​​measured by the measuring sensor

Images