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Semiconductor electronic device automatic cutting foot test all-in-one machine and its application

A technology for electronic devices and semiconductors, applied in the field of automatic cutting and testing integrated machines for semiconductor electronic devices, can solve the problems of inconsistent product pin lengths, low efficiency, low cutting accuracy, etc., to reduce manual contact with products. The effect of production efficiency and production cost reduction

Active Publication Date: 2021-01-29
SICHUAN LIPTAI ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0002] The existing manual cutting machine for semiconductor electronic devices can only produce about 1,000 products in one hour, and it has to go through multiple steps such as cutting, selection, manual pipe insertion, manual selection, and DC routine parameter testing. Due to the need for manual Operation, there are problems such as low efficiency and low cutting accuracy. For example, the error is often around 0.5mm, and the length of product pins cannot be consistent, and there will be situations of different lengths.
However, customers require that the pin length of the product is usually controlled within 0.2mm, which is difficult to meet customer requirements.
In addition, in the existing process, after manually cutting the feet, it is necessary to manually thread the pipe and then test the DC conventional parameters, which makes the production operation very inconvenient and costly, and the product quality cannot be effectively guaranteed. If the protection is not done well, it is easy to cause soft failure of the product, resulting in hidden dangers in quality

Method used

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  • Semiconductor electronic device automatic cutting foot test all-in-one machine and its application
  • Semiconductor electronic device automatic cutting foot test all-in-one machine and its application

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Embodiment Construction

[0026] Hereinafter, the semiconductor electronic device automatic cutting and testing all-in-one machine of the present invention and its application will be described in detail with reference to the accompanying drawings and exemplary embodiments.

[0027] One aspect of the present invention provides an all-in-one machine for automatic cutting and testing of semiconductor electronic devices.

[0028] figure 1 It shows a schematic structural view of the semiconductor electronic device automatic cutting and testing all-in-one machine of the present invention. figure 2 It shows a partial structural schematic diagram of the semiconductor electronic device automatic cutting leg testing all-in-one machine of the present invention, which mainly shows the automatic feeding bin, turning mechanism, feeding straight rail mechanism, leg cutting mechanism, testing mechanism and Distribution mechanism and other components.

[0029] In an exemplary embodiment of the present invention, as...

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Abstract

The invention provides an integrated machine for automatic cutting and testing of semiconductor electronic devices and its application. The all-in-one machine includes a main body frame, and an automatic feeding bin, a turning mechanism, a feeding straight rail mechanism, a foot cutting mechanism, a testing mechanism, a material distribution mechanism and a sorting box arranged on the main body frame, wherein the automatic feeding The bin can sense whether there is a product in the bin, and push out the product if there is any; the turning mechanism can move the pushed out product to the straight rail mechanism for discharging; the straight rail of the straight rail mechanism for discharging is equipped with an axial chute and an acceleration blow hole The cutting mechanism can cut the product; the testing mechanism is located downstream of the cutting mechanism and can test and judge the product; the material distributing mechanism can put the product into different sub-boxes of the classification box according to the test and judgment results. Said applications include applications in cutting and / or testing of semiconductor electronic devices. The invention can significantly reduce the production cost, improve the production efficiency and production quality; the cutting precision can reach ±0.1mm, and the precision is high.

Description

technical field [0001] The invention relates to the field of processing of semiconductor electronic devices, in particular to an automatic cutting and testing all-in-one machine for semiconductor electronic devices and its application. Background technique [0002] The existing manual cutting machine for semiconductor electronic devices can only produce about 1,000 products in one hour, and it has to go through multiple steps such as cutting, selection, manual tube insertion, manual selection, and DC routine parameter testing. Due to the need for manual Operation, there are problems such as low efficiency and low cutting accuracy. For example, the error is often about 0.5mm, and the length of product pins cannot be consistent, and there will be situations of different lengths. However, customers require that the pin length of the product is usually controlled within 0.2mm, which is difficult to meet the customer's requirements. In addition, in the existing process, after ma...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/48H01L21/66
CPCH01L21/4896H01L22/14H01L22/20
Inventor 陈明李力冷祥伟蔡少峰刘前
Owner SICHUAN LIPTAI ELECTRONICS