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Method and apparatus for maintaining integrity of data read from storage array

A storage array and integrity technology, applied in the input/output process of data processing, electrical digital data processing, data representation error detection/correction, etc., can solve the problem of increased bit error rate of flash memory, and achieve the goal of improving error correction capability Effect

Active Publication Date: 2020-12-11
SAGE MICROELECTRONICS CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the bit error rate of flash memory increases with the number of program / erase cycles and technology scaling

Method used

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  • Method and apparatus for maintaining integrity of data read from storage array
  • Method and apparatus for maintaining integrity of data read from storage array
  • Method and apparatus for maintaining integrity of data read from storage array

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Embodiment Construction

[0030] The detailed description of the present invention directly or indirectly simulates the operation of the technical solution of the present invention mainly through programs, steps, logic blocks, processes or other symbolic descriptions. In the ensuing description, numerous specific details are set forth in order to provide a thorough understanding of the present invention. Rather, the invention may be practiced without these specific details. These descriptions and representations herein are used by those skilled in the art to effectively convey the substance of their work to others skilled in the art. In other words, for the purpose of avoiding obscuring the present invention, well-known methods and procedures have not been described in detail since they have been readily understood.

[0031]Reference herein to "one embodiment" or "an embodiment" refers to a particular feature, structure or characteristic that can be included in at least one implementation of the prese...

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Abstract

The invention provides a method and apparatus for guaranteeing the integrity of data read from a storage array. According to one aspect of the present invention, the method comprises: receiving a databit array; forming at least one error matrix by merging errors in the data bit array; reversing the values of the data bits in the error matrix from '1' to '0' or from '0' to '1', and updating the data bit array with the reversed data bits in the error matrix; applying a first predefined ECC decoding operation to the data bit array having reversed data bits along a first dimension to detect and correct errors in the reversed data bits to produce the data bit array having some corrected data bits; and applying a second predefined ECC decoding operation to the data bit array having some corrected data bits along a second dimension to detect and correct remaining errors in the reversed data bits.

Description

technical field [0001] The present invention generally relates to the field of stored data management, and more specifically relates to data integrity and error correction in data management, and a method and device for error correction using matrix inversion. Background technique [0002] All kinds of electronic data are being created every moment. The need to retain or store data is now more than ever. Various techniques and devices have been developed to store these data. Data storage often consists of hardware components and storage media to hold data information. Examples of storage media include punched cards, hard disks, floppy disks, magnetic tape, optical disks, and semiconductors. Among semiconductor-based storage media, flash memory is an electrically erasable and reprogrammable nonvolatile memory that is widely used in many applications. A common use for flash memory is solid-state drives (SSDs, commonly known as solid-state drives), which can store large amo...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F3/06G06F11/10
CPCG06F3/0619G06F3/0688G06F11/108H03M13/19H03M13/2909H03M13/2921H03M13/2927G06F11/1012G06F11/1068G06F11/1072H03M13/458H03M13/616
Inventor 骆建军刘海銮楚传仁
Owner SAGE MICROELECTRONICS CORP