Automatic defect positioning and analyzing method and device and readable storage medium

A technology of automatic positioning and analysis methods, which is applied in semantic analysis, neural learning methods, natural language data processing, etc., and can solve problems such as low efficiency of positioning analysis methods

Pending Publication Date: 2020-12-11
PING AN TRUST CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The main purpose of the present invention is to provide a defect automatic location analysis method, equipment and computer-readable storage medium, aiming to solve the technical problem of low efficiency of the existing software defect location analysis method

Method used

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  • Automatic defect positioning and analyzing method and device and readable storage medium
  • Automatic defect positioning and analyzing method and device and readable storage medium
  • Automatic defect positioning and analyzing method and device and readable storage medium

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Embodiment Construction

[0074] It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0075] The defect automatic location analysis method involved in the embodiment of the present invention is mainly applied to defect automatic location analysis equipment, and the defect automatic location analysis equipment may be a PC, a portable computer, a mobile terminal and other devices with display and processing functions.

[0076] refer to figure 1 , figure 1 It is a schematic diagram of the hardware structure of the defect automatic location analysis device involved in the solution of the embodiment of the present invention. In the embodiment of the present invention, the device for automatic defect location and analysis may include a processor 1001 (such as a CPU), a communication bus 1002 , a user interface 1003 , a network interface 1004 , and a memory 1005 . Wherein, the communication bus 1002 is used...

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Abstract

The invention relates to an automatic testing tool, and provides an automatic defect positioning and analyzing method and device and a medium. According to the method, firstly the to-be-analyzed defect data is accurately matched based on a text similarity algorithm, so that a defect reason and a repairing scheme can be quickly matched for existing common defect problems in a defect knowledge base;when the accurate matching mode is invalid for the current to-be-analyzed defect data, fuzzy matching is further carried out, so that when an accurate result is not found out, the most matched resultwhich can be found in the current knowledge base is given; the knowledge base is updated and the defect data to be verified is calibrated when the accurate reason and the repair scheme of the defectdata to be verified are obtained, so that the defect analysis result of the defect data only through fuzzy matching can be perfected, and the knowledge base is adaptively optimized to further improvethe defect positioning analysis efficiency. In addition, the invention also relates to a blockchain technology, and the defect data to be verified can be stored in the blockchain.

Description

technical field [0001] The invention relates to the technical field of software testing, in particular to a defect automatic location analysis method, equipment and a computer-readable storage medium. Background technique [0002] Whether you are a software developer or a software tester, your daily work is closely related to software defects. Testers need to find program defects or functional problems as much as possible before the program project is officially launched, and the developers will repair them one by one, so as to ensure that the program project is delivered in high quality and stable according to the actual needs of users. This process often costs A lot of time, therefore, how to quickly and accurately locate the cause of defects, and carry out targeted and effective repairs is a long-term problem that developers and testers need to face. [0003] At present, the inspection and location of software defects in the industry are mainly carried out manually throu...

Claims

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Application Information

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IPC IPC(8): G06F11/36G06F16/2453G06F16/2458G06F16/248G06F16/28G06F40/216G06F40/289G06F40/295G06F40/30G06N3/04G06N3/08
CPCG06F11/3604G06F16/2468G06F16/2453G06F40/216G06F40/289G06F40/295G06F40/30G06F16/248G06F16/285G06F16/288G06N3/049G06N3/08G06N3/045
Inventor 黄蕾
Owner PING AN TRUST CO LTD
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