Circuit structure for improving electromagnetic radiation of processor clock signal end and forming method thereof

Abstract

The invention provides a circuit structure for improving electromagnetic radiation of a clock signal end of a processor and a forming method of the circuit structure, and the circuit structure for improving electromagnetic radiation of the clock signal end of the processor comprises the processor, the processor comprises at least one clock signal end, a function module, a pulse width modulation signal port and an IO port, the function module is electrically connected with the clock signal end, and a circuit is electrically connected between the pulse width modulation signal port and the IO port to form at least one offset loop. Therefore, the electromagnetic radiation generated by the electrical connection between the clock signal end and the function module is counteracted. According to the circuit structure for improving the electromagnetic radiation of the clock signal end of the processor, the electromagnetic field offset can be realized by utilizing elements in the processor, so that the electromagnetic radiation of the clock signal end of the processor is improved, and extra electromagnetic radiation is not generated.

Description

technical field [0001] The invention relates to the technical field of electromagnetic radiation design, specifically, the invention relates to a circuit structure for improving electromagnetic radiation at a processor clock signal terminal. Background technique [0002] As the use of electronic products becomes more and more popular, the requirements for their safety are getting higher and higher. Electromagnetic radiation has become the focus of people's attention. It is mainly tested through EMC testing. EMC testing is also called electromagnetic compatibility EMC, which refers to The comprehensive evaluation of EMI and anti-interference ability EMS of electronic products in the electromagnetic field is one of the most important indicators of the quality of electronic products. The impact of electrical products. Electromagnetic compatibility is a subject that studies the coexistence of various electrical equipment under the conditions of limited space, time, and spectrum...

AI Technical Summary

Problems solved by technology

[0005] There are generally two conventional solutions to RE radiation. One is to try to find the radiation source and reduce the radiation by modifying the electrical parameters of the circuit resistance. Although the problem of RE test exceeding the standard is reduced, other problems are often introduced, such as signal drive capability. The decrease of the signal quality caused by the poor signal quality, and more experiments are needed to demonstrate the stability of the method, because a RE test exceeds the standard problem, many previous circuit stability experiments will be done again, which increases the time cost

[0006] In addition, there is a part of the signal that is difficult to remove from the circuit due to the circuit structure itself. In this case, the common practice in the current prior art is to reduce the electromagnetic radiation generated by adding a metal shielding frame. block out

But this method also has its inherent disadvantages. First, due to the need to increase the metal shielding frame, it will inevitably increase the number of parts of the circuit structure itself and the volume of the circuit structure, which is obviously limited for some small and micro electronic products; In addition, due to the increase of the metal shielding frame, this method will also increase the cost, which will affect the cost control of the product and the acceptance of consumers.

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