Complex analog circuit fault identification and estimation method and system
A technology for simulating circuit faults and simulating circuits, which is applied in the field of complex analog circuit fault identification and estimation methods and systems, can solve the problems of strong parameter dependence, high internal operation complexity, and high cost of comprehensive modeling, and achieve high operation efficiency, Identify the exact effect
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[0040]In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.
[0041] Such as figure 1 As shown, a complex analog circuit fault identification and estimation method of the present invention comprises the following steps:
[0042] (1) Establish the degradation simulation model of the analog circuit to be diagnosed, conduct the parameter aging simulation experiment of different devices, and select the current or voltage of several branches as the observation ...
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