Wheat planting region segmentation and yield prediction method

A technology for area segmentation and yield prediction, applied in the fields of image processing and remote sensing, can solve the problems of unguaranteed model prediction results, large amount of meteorological environment data, and algorithm convergence, etc., to save manpower and time costs, good robustness and Accuracy, the effect of accurate yield forecast results
CN112183428AInactive Publication Date: 2021-01-05浙江大学中原研究院 +1
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
浙江大学中原研究院
Publication Date
2021-01-05
Estimated Expiration
Not applicable · inactive patent

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Abstract

The invention discloses a wheat planting area segmentation and yield prediction method, and existing open multispectral remote sensing data and satellite monitoring meteorological environment data areused to realize the accurate segmentation of a winter wheat planting area and a scientific yield estimation method. Therefore, the time, labor and financial costs caused by large-scale on-site surveying and mapping and meteorological monitoring are avoided. Meanwhile, the model has good mobility, can be applied to the segmentation of a planting area of winter wheat and the prediction of the yieldand can also be effectively applied to other crops, and agricultural modernization and business become possible.
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Description

Technical field

[0001] The invention belongs to the technical field of image processing and remote sensing, and specifically relates to a method for segmentation and yield prediction of wheat planting regions.Background technique

[0002] The growth of wheat is affected by many external environmental factors such as solar radiation, atmosphere, hydrology, soil and so on. Through the comprehensive application of professional knowledge in the field of remote sensing and mathematical optimization algorithms, a quantitative expression of the external environmental factors of wheat growth and the biological growth characteristics of wheat through multi-spectrum are obtained, and thus the segmentation of the planting area and the construction of a yield estimation model are realized. Due to the need to collect more statistical growth environment data, the manual use of instruments for field monitoring will inevitably consume a lot of manpower and material resources. Reliable and stable monitori...

Claims

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